Tc max
3.7 K
Tc ambient
3.7 K
arXiv year
1986
Papers
98
Tc exp.
4.7 K
Tc theo.
4.0 K
Evidence
experimental
Tc max measured at thin_film, arXiv:1912.03242, confirmed by 3 papers
Evidence (114 records from 98 papers)
the flat columns above are aggregates — each line here is one paper's claim| Tc (K) | P (GPa) | Sample | Method | Pairing | Year | Tier | Paper |
|---|---|---|---|---|---|---|---|
| 5.0 | — | — | — | — | 2025 | — | 2501.17465 |
| 4.7 | — | thin_film | STM | — | 2020 | T1 | DOI: 10.1103/PhysRevLett.125.117001 |
| 4.7 | — | thin_film | — | unknown | 2019 | — | 1912.03242 |
| 4.5 | — | thin_film | resistivity | — | 2002 | T1 | DOI: 10.1103/PhysRevB.66.052509 |
| 4.1 | — | single_crystal | resistivity | — | 2005 | T1 | DOI: 10.1103/PhysRevB.71.104521 |
| 4.0 | — | powder | susceptibility | — | 2008 | T1 | DOI: 10.1103/PhysRevB.77.094508 |
| 4.0 | — | — | — | — | 2026 | T2 | 2603.05123 |
| 3.9 | — | thin_film | resistivity | — | 2003 | T1 | cond-mat/0305362 |
| 3.9 | — | thin_film | resistivity | — | 2004 | T1 | cond-mat/0406581 |
| 3.9 | — | thin_film | resistivity | — | 2004 | T1 | cond-mat/0407078 |
| 3.9 | — | thin_film | resistivity | — | 2003 | T1 | cond-mat/0305584 |
| 3.8 | — | thin_film | resistivity | — | 2007 | T1 | 0707.2381 |
| 3.8 | — | thin_film | resistivity | — | 2006 | — | cond-mat/0607007 |
| 3.8 | — | thin_film | resistivity | — | 2014 | T2 | 1410.7587 |
| 3.8 | — | thin_film | resistivity | — | 2014 | T2 | 1410.7587 |
| 3.8 | — | thin_film | resistivity | — | 2006 | — | cond-mat/0607007 |
| 3.8 | — | thin_film | resistivity | — | 2014 | T2 | 1410.7587 |
| 3.8 | — | thin_film | resistivity | — | 2006 | — | cond-mat/0607007 |
| 3.8 | — | polycrystal | resistivity | — | 2018 | T1 | 1808.02832 |
| 3.8 | — | — | — | — | 2017 | T1 | 1712.06716 |
| 3.8 | — | thin_film | resistivity | s-wave | 2012 | T1 | DOI: 10.1103/PhysRevB.85.104508 |
| 3.8 | — | — | — | — | 2011 | T1 | 1105.0229 |
| 3.8 | — | — | resistivity | — | 2008 | T1 | 0806.4599 |
| 3.8 | — | thin_film | resistivity | — | 1988 | T1 | DOI: 10.1103/PhysRevLett.60.2414 |
| 3.8 | — | thin_film | resistivity | — | 2019 | T1 | 1904.02621 |
| 3.8 | — | thin_film | resistivity | — | 2014 | T2 | 1410.7587 |
| 3.8 | — | thin_film | resistivity | — | 2007 | T1 | 0707.2381 |
| 3.8 | — | single_crystal | resistivity | — | 2001 | T1 | DOI: 10.1103/PhysRevB.63.092506 |
| 3.8 | — | polycrystal | resistivity | — | 1987 | T1 | DOI: 10.1103/PhysRevB.36.2301 |
| 3.8 | ambient | thin_film | resistivity | — | 2025 | T1 | DOI: 10.1103/PhysRevB.111.104513 |
| 3.8 | ambient | — | susceptibility | — | 2003 | T1 | cond-mat/0308311 |
| 3.8 | — | thin_film | resistivity | — | 1987 | T1 | DOI: 10.1103/PhysRevLett.59.489 |
| 3.7 | — | single_crystal | susceptibility | — | 2005 | T1 | DOI: 10.1103/PhysRevB.72.174510 |
| 3.7 | ambient | wire | susceptibility | — | 2025 | T1 | DOI: 10.1103/PhysRevB.111.104513 |
| 3.7 | ambient | — | susceptibility | — | 2025 | T1 | DOI: 10.1103/PhysRevB.111.104507 |
| 3.7 | — | thin_film | resistivity | — | 2023 | T1 | 2310.10923 |
| 3.7 | — | single_crystal | susceptibility | — | 2012 | T1 | DOI: 10.1103/PhysRevLett.109.197003 |
| 3.7 | ambient | thin_film | resistivity | — | 1986 | T1 | DOI: 10.1103/PhysRevLett.56.378 |
| 3.7 | — | polycrystal | muSR | — | 2019 | — | 1905.04228 |
| 3.7 | — | polycrystal | muSR | — | 2019 | T1 | DOI: 10.1103/PhysRevB.99.184515 |
| 3.7 | — | thin_film | resistivity | — | 2014 | T2 | 1410.7587 |
| 3.7 | ambient | polycrystal | muSR | — | 2024 | T1 | DOI: 10.1103/PhysRevB.110.214515 |
| 3.7 | ambient | wire | resistivity | — | 2024 | T1 | 2407.08000 |
| 3.7 | — | — | susceptibility | — | 2020 | T1 | 2004.06993 |
| 3.7 | — | thin_film | resistivity | — | 2019 | T1 | 1908.03362 |
| 3.7 | — | wire | susceptibility | — | 2007 | T1 | DOI: 10.1103/PhysRevB.75.014510 |
| 3.7 | — | single_crystal | resistivity | — | 2005 | T1 | DOI: 10.1103/PhysRevB.71.104521 |
| 3.7 | — | wire | resistivity | — | 2005 | T1 | DOI: 10.1103/PhysRevLett.95.076802 |
| 3.7 | — | thin_film | resistivity | — | 2005 | T1 | cond-mat/0502111 |
| 3.7 | — | thin_film | resistivity | — | 1986 | T1 | DOI: 10.1103/PhysRevB.33.3549 |
| 3.6 | — | polycrystal | susceptibility | — | 2025 | T1 | DOI: 10.1103/v5ks-l9qs |
| 3.6 | — | thin_film | resistivity | s-wave | 2022 | T1 | DOI: 10.1103/PhysRevMaterials.6.034203 |
| 3.6 | — | single_crystal | resistivity | — | 2004 | T1 | cond-mat/0407464 |
| 3.5 | — | — | resistivity | — | 2010 | T1 | DOI: 10.1103/PhysRevLett.104.047001 |
| 3.5 | — | thin_film | resistivity, susceptibility | — | 1994 | T1 | DOI: 10.1103/PhysRevB.49.3600 |
| 1.7 | — | thin_film | resistivity | — | 2025 | T1 | DOI: 10.1103/jndq-cxmf |
| 1.5 | — | thin_film | resistivity | — | 2025 | T1 | DOI: 10.1103/jndq-cxmf |
| 1.0 | — | thin_film | resistivity | — | 2025 | T1 | DOI: 10.1103/jndq-cxmf |
| 0.5 | — | thin_film | resistivity | — | 2025 | T1 | DOI: 10.1103/jndq-cxmf |
| — | — | thin_film | resistivity | — | 2025 | T1 | DOI: 10.1103/PhysRevB.111.L161401 |
| — | — | thin_film | resistivity | — | 2025 | T1 | 2503.13725 |
| — | — | thin_film | STM | d-wave | 2025 | T1 | 2507.18693 |
| — | — | — | specific_heat, susceptibility | — | 2024 | — | 2403.01719 |
| — | ambient | — | muSR | — | 2024 | T1 | 2408.13857 |
| — | 1.6 | — | muSR | — | 2024 | T1 | 2408.13857 |
| — | 2.5 | — | muSR | — | 2024 | T1 | 2408.13857 |
| — | 2.9 | — | muSR | — | 2024 | T1 | 2408.13857 |
| — | — | thin_film | resistivity | — | 2023 | T1 | 2308.00893 |
| — | — | thin_film | STM | d-wave | 2022 | T1 | 2210.06273 |
| — | — | thin_film | STM | — | 2022 | T1 | DOI: 10.1103/PhysRevLett.128.206802 |
| — | — | thin_film | resistivity | — | 2022 | T3 | 2212.13314 |
| — | — | thin_film | — | p-wave | 2021 | T1 | 2107.03482 |
| — | — | thin_film | resistivity | — | 2019 | T1 | 1908.03362 |
| — | — | — | resistivity | — | 2019 | T3 | 1906.04380 |
| — | — | — | — | — | 2019 | T3 | 1904.06182 |
| — | — | — | — | — | 2019 | T1 | 1907.01873 |
| — | — | — | susceptibility | — | 2019 | T1 | 1909.04271 |
| — | — | thin_film | resistivity | — | 2019 | T1 | 1912.06071 |
| — | — | — | resistivity | — | 2016 | T1 | 1605.04273 |
| — | — | — | resistivity | — | 2013 | T1 | 1309.5331 |
| — | — | polycrystal | muSR | — | 2013 | T1 | DOI: 10.1103/PhysRevB.87.104508 |
| — | — | — | — | — | 2013 | T3 | 1309.6255 |
| — | — | thin_film | resistivity | — | 2011 | T1 | 1101.1914 |
| — | — | — | resistivity | — | 2009 | T1 | 0906.0078 |
| — | — | thin_film | resistivity | — | 2009 | T3 | 0911.5329 |
| — | — | — | — | s-wave | 2008 | T1 | DOI: 10.1103/PhysRevB.77.104510 |
| — | — | wire | resistivity | — | 2008 | T1 | DOI: 10.1103/PhysRevB.78.045414 |
| — | — | — | susceptibility | — | 2008 | T1 | 0811.2554 |
| — | — | thin_film | — | — | 2007 | T1 | DOI: 10.1103/PhysRevB.75.014519 |
| — | — | — | resistivity | — | 2007 | T1 | DOI: 10.1103/PhysRevB.75.140502 |
| — | — | — | — | — | 2006 | T2 | cond-mat/0605119 |
| — | — | — | susceptibility | — | 2006 | T1 | cond-mat/0602089 |
| — | — | — | resistivity | — | 2004 | T2 | cond-mat/0412614 |
| — | — | wire | resistivity | — | 2003 | T1 | DOI: 10.1103/PhysRevLett.91.157001 |
| — | — | thin_film | resistivity | — | 2003 | T1 | DOI: 10.1103/PhysRevLett.91.267001 |
| — | — | wire | resistivity | — | 2003 | T1 | cond-mat/0304193 |
| — | — | thin_film | resistivity | — | 2002 | T1 | cond-mat/0209023 |
| — | — | — | resistivity | — | 2000 | T1 | cond-mat/0008116 |
| — | — | wire | resistivity | — | 1998 | T1 | DOI: 10.1103/PhysRevB.58.14199 |
| — | — | powder | susceptibility | — | 1998 | T1 | DOI: 10.1103/PhysRevB.58.6468 |
| — | — | wire | resistivity | — | 1994 | T1 | DOI: 10.1103/PhysRevB.50.16741 |
| — | — | single_crystal | — | — | 1991 | T1 | DOI: 10.1103/PhysRevB.43.5321 |
| — | — | thin_film | resistivity | — | 1990 | T1 | DOI: 10.1103/PhysRevLett.65.1263 |
| — | — | thin_film | resistivity | — | 1990 | T1 | DOI: 10.1103/PhysRevB.42.206 |
| — | — | thin_film | resistivity | — | 1989 | T1 | DOI: 10.1103/PhysRevB.40.11370 |
| — | — | thin_film | resistivity | — | 1989 | T1 | DOI: 10.1103/PhysRevB.40.182 |
| — | — | thin_film | resistivity | — | 1989 | T1 | DOI: 10.1103/PhysRevB.40.719 |
| — | — | thin_film | resistivity, STM | — | 1989 | T1 | DOI: 10.1103/PhysRevB.40.6680 |
| — | — | thin_film | resistivity | — | 1988 | T1 | DOI: 10.1103/PhysRevB.37.3324 |
| — | — | thin_film | resistivity | — | 1987 | T1 | DOI: 10.1103/PhysRevB.36.8408 |
| — | — | thin_film | — | — | 1986 | T1 | DOI: 10.1103/PhysRevB.34.7748 |
| — | ambient | — | — | — | 1986 | T1 | DOI: 10.1103/PhysRevB.34.4552 |
| — | — | thin_film | resistivity | — | 1986 | T1 | DOI: 10.1103/PhysRevB.33.4604 |
| — | — | thin_film | resistivity | — | 1986 | T1 | DOI: 10.1103/PhysRevB.34.203 |
Structure
- Crystal structure
- beta-Sn
- Space group
- I41/amd
Superconducting parameters
- Gap structure
- full_gap
- Hc2
- 4.0 T (at 300 mK)
- λ_eph (e–ph coupling)
- 0.74
Samples & pressure
- Sample form
- thin_film
- Substrate
- Si(111)
- Pressure type
- none
- Doping type
- none
- Doping level
- 0.100