Sn

conventional

ambient SC2D / interfacedisputed

Tc max

3.9 K

Tc ambient

3.9 K

Discovery

1997

Papers

Tc max measured at ambient, thin_film, resistivity, arXiv:cond-mat/0305362, confirmed by 2 papers

Evidence (22 records from 19 papers)

the flat columns above are aggregates — each line here is one paper's claim

Tc (K)	P (GPa)	Sample	Method	Pairing	Year	Paper
4.5	ambient	thin_film	resistivity	—	2002	cond-mat/0202342
3.9	ambient	thin_film	resistivity	—	2003	cond-mat/0305362
3.9	ambient	thin_film	resistivity	—	2004	cond-mat/0406581
3.9	ambient	thin_film	resistivity	—	2004	cond-mat/0407078
3.9	ambient	thin_film	resistivity	—	2003	cond-mat/0305584
3.7	ambient	—	—	—	2001	cond-mat/0110267
3.7	ambient	wire	resistivity	—	2004	cond-mat/0407464
3.7	ambient	wire	resistivity	—	2004	cond-mat/0407464
3.7	ambient	single_crystal	resistivity	—	2005	cond-mat/0502111
3.7	ambient	wire	resistivity	—	2004	cond-mat/0407464
3.1	ambient	wire	resistivity	—	2004	cond-mat/0407464
—	ambient	single_crystal	—	—	2005	cond-mat/0504277
—	ambient	—	—	—	2004	cond-mat/0401313
—	ambient	—	—	—	2004	cond-mat/0401374
—	ambient	wire	resistivity	—	2003	cond-mat/0304193
—	ambient	thin_film	resistivity	—	2002	cond-mat/0209023
—	ambient	—	—	—	2002	cond-mat/0211643
—	—	—	specific_heat	—	2001	cond-mat/0108251
—	ambient	—	—	—	2000	cond-mat/0009328
—	ambient	polycrystal	STM	—	1998	cond-mat/9801170
—	ambient	powder	—	—	1998	cond-mat/9812042
—	ambient	thin_film	—	—	1997	cond-mat/9706032