Tc max
4.2 K
Tc ambient
4.2 K
arXiv year
2020
Papers
2
Tc exp.
4.2 K
Tc theo.
—
Evidence
experimental
Tc max measured at thin_film, resistivity, DOI: 10.1103/PhysRevMaterials.4.091202, confirmed by 2 papers
Evidence (2 records from 2 papers)
the flat columns above are aggregates — each line here is one paper's claim| Tc (K) | P (GPa) | Sample | Method | Pairing | Year | Tier | Paper |
|---|---|---|---|---|---|---|---|
| 4.2 | — | thin_film | resistivity | — | 2020 | T1 | DOI: 10.1103/PhysRevMaterials.4.091202 |
| 4.2 | ambient | thin_film | — | — | 2020 | T1 | 2009.14494 |
Structure
- Crystal structure
- rocksalt
Superconducting parameters
- Hc2
- 2.7 T (0 K, H perpendicular to film)
- λ_eph (e–ph coupling)
- —
Samples & pressure
- Sample form
- thin_film
- Substrate
- InP(111)A
- Doping type
- isovalent
- Doping level
- 0.550