Tc max
4.8 K
Tc ambient
4.5 K
arXiv year
2012
Papers
19
Tc exp.
4.8 K
Tc theo.
—
Evidence
experimental
Tc max measured at polycrystal, susceptibility, DOI: 10.1103/PhysRevB.90.064508, confirmed by 2 papers
Evidence (25 records from 19 papers)
the flat columns above are aggregates — each line here is one paper's claim| Tc (K) | P (GPa) | Sample | Method | Pairing | Year | Tier | Paper |
|---|---|---|---|---|---|---|---|
| 4.9 | — | polycrystal | resistivity | — | 2018 | T1 | DOI: 10.1103/PhysRevMaterials.2.044802 |
| 4.8 | — | polycrystal | susceptibility | s-wave | 2014 | T1 | DOI: 10.1103/PhysRevB.90.064508 |
| 4.8 | — | polycrystal | resistivity | — | 2018 | T1 | DOI: 10.1103/PhysRevMaterials.2.044802 |
| 4.5 | ambient | single_crystal | susceptibility | — | 2013 | T1 | DOI: 10.1103/PhysRevB.88.020505 |
| 4.2 | — | thin_film | resistivity | — | 2020 | T1 | DOI: 10.1103/PhysRevMaterials.4.091202 |
| 3.5 | — | thin_film | resistivity | s-wave | 2024 | T1 | DOI: 10.1103/PhysRevB.109.014513 |
| 3.1 | — | polycrystal | resistivity | — | 2018 | T1 | DOI: 10.1103/PhysRevMaterials.2.044802 |
| 2.0 | — | thin_film | resistivity | — | 2019 | T1 | DOI: 10.1103/PhysRevMaterials.3.101201 |
| 1.9 | — | single_crystal | resistivity, specific_heat | — | 2013 | T1 | 1309.1340 |
| 1.4 | — | single_crystal | resistivity, specific_heat | unknown | 2013 | T1 | DOI: 10.1103/PhysRevB.88.140502 |
| 1.4 | — | single_crystal | specific_heat | unknown | 2013 | T1 | DOI: 10.1103/PhysRevB.88.140502 |
| 1.2 | — | single_crystal | specific_heat | unknown | 2013 | T1 | DOI: 10.1103/PhysRevB.88.140502 |
| 1.2 | — | single_crystal | resistivity | — | 2012 | T1 | DOI: 10.1103/PhysRevLett.109.217004 |
| 1.2 | — | single_crystal | resistivity | — | 2012 | T1 | 1208.0059 |
| 0.9 | — | thin_film | STM | — | 2019 | T1 | DOI: 10.1103/PhysRevMaterials.3.101201 |
| — | — | thin_film | — | — | 2025 | — | 2503.09872 |
| — | — | thin_film | resistivity | unknown | 2021 | — | 2112.01569 |
| — | — | thin_film | resistivity, STM | s-wave | 2019 | T1 | 1910.09381 |
| — | — | single_crystal | resistivity | — | 2018 | T1 | DOI: 10.1103/PhysRevB.98.054503 |
| — | — | single_crystal | resistivity | — | 2018 | T1 | 1802.09882 |
| — | — | thin_film | ARPES | — | 2016 | T1 | DOI: 10.1103/PhysRevB.93.075132 |
| — | — | — | — | — | 2015 | T1 | 1507.03335 |
| — | — | polycrystal | resistivity, susceptibility, specific_heat | — | 2015 | T1 | 1510.07266 |
| — | — | thin_film | — | — | 2014 | T1 | 1410.4852 |
| — | — | — | resistivity, point_contact_spectroscopy | — | 2012 | T1 | 1208.0059 |
Structure
- Crystal structure
- rocksalt
- Space group
- Fm3-m
Superconducting parameters
- Pairing symmetry
- s-wave
- Gap structure
- full_gap
- Hc2
- 0.3 T (0.37 K)
- λ_eph (e–ph coupling)
- —
Samples & pressure
- Substrate
- Bi2Te3
- Doping type
- hole
- Doping level
- 0.045