Tc max
3.2 K
Tc ambient
2.5 K
arXiv year
2009
Papers
2
Tc exp.
3.2 K
Tc theo.
—
Evidence
experimental
Tc max measured at thin_film, resistivity, arXiv:0910.4445
Evidence (3 records from 2 papers)
the flat columns above are aggregates — each line here is one paper's claim| Tc (K) | P (GPa) | Sample | Method | Pairing | Year | Tier | Paper |
|---|---|---|---|---|---|---|---|
| 3.2 | — | thin_film | resistivity | — | 2009 | T1 | 0910.4445 |
| 2.5 | ambient | polycrystal | resistivity | — | 2018 | — | 1808.08500 |
| 1.5 | ambient | polycrystal | specific_heat |
Structure
- Crystal structure
- R3m(00γ)
- Space group
- R3m(00γ) (#166.1)
- Lattice a (Å)
- 4.331
- Lattice c (Å)
- 5.352
Superconducting parameters
- Hc2
- 0.2 T (extrapolated to 0 K from resistivity)
- λ_eph (e–ph coupling)
- 0.58
- ω_log
- 208 K
Competing orders
- ρ(T) exponent
- 2.40