Tc max
35.5 K
Tc ambient
35.3 K
arXiv year
2008
Papers
16
Tc exp.
35.5 K
Tc theo.
—
Evidence
experimental
Tc max measured at single_crystal, resistivity, DOI: 10.1103/PhysRevB.78.224512, confirmed by 2 papers
Evidence (18 records from 16 papers)
the flat columns above are aggregates — each line here is one paper's claim| Tc (K) | P (GPa) | Sample | Method | Pairing | Year | Tier | Paper |
|---|---|---|---|---|---|---|---|
| 35.6 | — | single_crystal | specific_heat | — | 2008 | T1 | DOI: 10.1103/PhysRevB.78.224512 |
| 35.5 | ambient | single_crystal | resistivity | — | 2012 | T3 | 1203.6592 |
| 35.5 | — | single_crystal | resistivity | — | 2008 | T1 | DOI: 10.1103/PhysRevB.78.224512 |
| 35.3 | — | wire | — | — | 2009 | — | 0901.3410 |
| 35.0 | — | single_crystal | resistivity | — | 2008 | T1 | 0806.2648 |
| 34.0 | — | wire | resistivity | — | 2009 | T1 | 0911.3701 |
| 31.1 | 1.1 | wire | susceptibility | — | 2017 | T1 | DOI: 10.1103/PhysRevMaterials.1.044805 |
| 30.0 | — | — | neutron | — | 2008 | — | 0810.4498 |
| 29.6 | ambient | wire | susceptibility | — | 2017 | T1 | DOI: 10.1103/PhysRevMaterials.1.044805 |
| 20.0 | — | — | resistivity, susceptibility | — | 2008 | T1 | 0806.1209 |
| — | — | thin_film | — | — | 2016 | T1 | 1604.05838 |
| — | — | polycrystal | — | — | 2014 | T1 | 1403.6704 |
| — | — | polycrystal | resistivity | — | 2014 | T1 | 1408.4516 |
| — | — | wire | resistivity | — | 2013 | T1 | 1309.7618 |
| — | — | wire | resistivity | — | 2012 | T1 | 1212.5873 |
| — | — | polycrystal | resistivity | — | 2010 | T1 | 1002.4305 |
| — | — | polycrystal | susceptibility | — | 2010 | T3 | 1012.3572 |
| — | — | polycrystal | susceptibility | — | 2009 | T1 | 0904.3145 |
Structure
- Crystal structure
- ThCr2Si2-type
- Space group
- I4/mmm
Superconducting parameters
- Hc2
- 140.0 T (0 K)
- λ_eph (e–ph coupling)
- —
Competing orders
- ρ(T) exponent
- 2.00
Samples & pressure
- Doping type
- hole
- Doping level
- 0.400