Tc max
28.0 K
Tc ambient
28.0 K
arXiv year
2009
Papers
7
Tc exp.
26.5 K
Tc theo.
—
Evidence
experimental
Tc max measured at thin_film, resistivity, arXiv:1103.1548, confirmed by 3 papers
Evidence (14 records from 7 papers)
the flat columns above are aggregates — each line here is one paper's claim| Tc (K) | P (GPa) | Sample | Method | Pairing | Year | Tier | Paper |
|---|---|---|---|---|---|---|---|
| 28.0 | — | thin_film | resistivity | — | 2011 | T1 | 1103.1548 |
| 26.5 | — | thin_film | resistivity | — | 2016 | T1 | DOI: 10.1103/PhysRevB.94.054504 |
| 26.5 | — | thin_film | resistivity | — | 2015 | T1 | 1510.01612 |
| 26.0 | — | thin_film | resistivity | — | 2009 | T1 | DOI: 10.1103/PhysRevB.80.024501 |
| 23.3 | — | thin_film | resistivity | — | 2016 | T1 | DOI: 10.1103/PhysRevB.94.054504 |
| 23.3 | — | thin_film | resistivity | — | 2015 | T1 | 1510.01612 |
| 20.0 | — | — | resistivity | — | 2012 | T1 | 1203.6746 |
| 19.0 | — | thin_film | susceptibility | s-wave | 2010 | T1 | 1003.5559 |
| 15.0 | — | thin_film | susceptibility | s-wave | 2010 | T1 | 1003.5559 |
| 14.0 | — | thin_film | susceptibility | s-wave | 2010 | T1 | 1003.5559 |
| 13.0 | — | thin_film | susceptibility | s-wave | 2010 | T1 | 1003.5559 |
| 12.0 | — | thin_film | resistivity | — | 2011 | T1 | 1103.1548 |
| 11.0 | — | thin_film | susceptibility | s-wave | 2010 | T1 | 1003.5559 |
| — | — | thin_film | resistivity | — | 2012 | — | 1201.3790 |
Structure
- Crystal structure
- tetragonal
- Phase
- infinite_layer
- Lattice a (Å)
- 3.988
- Lattice c (Å)
- 3.397
Superconducting parameters
- Pairing symmetry
- d-wave
- λ_eph (e–ph coupling)
- —
Competing orders
- ρ(T) exponent
- 1.18
Samples & pressure
- Sample form
- thin_film
- Substrate
- KTaO3
- Doping type
- electron
- Doping level
- 0.120