Tc max
38.0 K
Tc ambient
38.0 K
arXiv year
2008
Papers
7
Tc exp.
32.0 K
Tc theo.
—
Evidence
experimental
Tc max measured at resistivity, arXiv:0806.1209, confirmed by 2 papers
Evidence (7 records from 7 papers)
the flat columns above are aggregates — each line here is one paper's claim| Tc (K) | P (GPa) | Sample | Method | Pairing | Year | Tier | Paper |
|---|---|---|---|---|---|---|---|
| 38.0 | — | — | resistivity, susceptibility | — | 2008 | T1 | 0806.1209 |
| 32.0 | — | — | STM | unknown | 2008 | — | 0806.4400 |
| 26.0 | — | single_crystal | resistivity, susceptibility | unknown | 2008 | T1 | 0808.2185 |
| 26.0 | — | single_crystal | ARPES | — | 2008 | T1 | DOI: 10.1103/PhysRevB.78.184508 |
| 20.0 | ambient | polycrystal | resistivity | — | 2013 | T1 | 1302.4855 |
| — | — | polycrystal | resistivity | — | 2015 | — | 1504.02219 |
| — | — | single_crystal | — | — | 2009 | T1 | DOI: 10.1103/PhysRevLett.102.127003 |
Structure
- Crystal structure
- ThCr2Si2-type
- Space group
- I4/mmm
Superconducting parameters
- λ_eph (e–ph coupling)
- —
Samples & pressure
- Sample form
- single_crystal