Tc max
22.0 K
Tc ambient
22.0 K
arXiv year
2010
Papers
2
Tc exp.
22.0 K
Tc theo.
—
Evidence
experimental
Tc max measured at polycrystal, resistivity, DOI: 10.1103/PhysRevB.82.180512
Evidence (2 records from 2 papers)
the flat columns above are aggregates — each line here is one paper's claim| Tc (K) | P (GPa) | Sample | Method | Pairing | Year | Tier | Paper |
|---|---|---|---|---|---|---|---|
| 22.0 | — | polycrystal | resistivity, susceptibility | — | 2010 | T1 | DOI: 10.1103/PhysRevB.82.180512 |
| 20.8 | — | thin_film | resistivity | — | 2013 | T1 | 1302.0340 |
Superconducting parameters
- λ_eph (e–ph coupling)
- —
Samples & pressure
- Doping type
- electron
- Doping level
- 0.400