Tc max
20.0 K
Tc ambient
20.0 K
arXiv year
2009
Papers
2
Tc exp.
20.0 K
Tc theo.
—
Evidence
experimental
Tc max measured at resistivity, arXiv:0903.4668, confirmed by 2 papers
Evidence (2 records from 2 papers)
the flat columns above are aggregates — each line here is one paper's claim| Tc (K) | P (GPa) | Sample | Method | Pairing | Year | Tier | Paper |
|---|---|---|---|---|---|---|---|
| 20.0 | — | — | resistivity, susceptibility, specific_heat | — | 2009 | T1 | 0903.4668 |
| 20.0 | — | polycrystal | resistivity | — | 2009 | T1 | DOI: 10.1103/PhysRevB.79.214516 |
Structure
- Crystal structure
- ThCr2Si2 type
- Space group
- I4/mmm
Superconducting parameters
- λ_eph (e–ph coupling)
- —
Samples & pressure
- Doping type
- isovalent