Tc max
0.6 K
Tc ambient
0.5 K
arXiv year
2002
Papers
77
Tc exp.
0.6 K
Tc theo.
17.0 K
Evidence
experimental
Tc max measured at thin_film, resistivity, DOI: 10.1103/PhysRevB.101.100503, confirmed by 3 papers
Evidence (100 records from 77 papers)
the flat columns above are aggregates — each line here is one paper's claim| Tc (K) | P (GPa) | Sample | Method | Pairing | Year | Tier | Paper |
|---|---|---|---|---|---|---|---|
| 17.0 | — | — | — | s-wave | 2013 | T3 | 1307.2363 |
| 7.0 | — | — | — | — | 2018 | T1 | DOI: 10.1103/PhysRevB.97.144506 |
| 6.4 | — | single_crystal | resistivity | — | 2010 | T1 | DOI: 10.1103/PhysRevB.82.172507 |
| 3.0 | — | single_crystal | resistivity | — | 2010 | T1 | DOI: 10.1103/PhysRevB.82.172507 |
| 0.6 | — | thin_film | resistivity | — | 2021 | T1 | DOI: 10.1103/PhysRevMaterials.5.104801 |
| 0.6 | — | thin_film | resistivity | — | 2020 | T1 | DOI: 10.1103/PhysRevB.101.100503 |
| 0.6 | — | thin_film | resistivity | — | 2021 | T1 | DOI: 10.1103/PhysRevMaterials.5.104801 |
| 0.6 | — | thin_film | resistivity | — | 2021 | T1 | DOI: 10.1103/PhysRevMaterials.5.104801 |
| 0.5 | — | thin_film | resistivity | — | 2023 | T1 | DOI: 10.1103/PhysRevB.107.L100504 |
| 0.5 | — | thin_film | resistivity | s-wave | 2026 | T1 | DOI: 10.1103/qvp7-z9vj |
| 0.5 | — | thin_film | resistivity | unknown | 2025 | T2 | 2509.16408 |
| 0.5 | ambient | single_crystal | resistivity | — | 2014 | T1 | DOI: 10.1103/PhysRevLett.112.207002 |
| 0.4 | — | thin_film | resistivity | — | 2024 | T3 | 2402.14051 |
| 0.4 | — | thin_film | resistivity | — | 2024 | T1 | DOI: 10.1103/PhysRevMaterials.8.084803 |
| 0.4 | — | — | resistivity | s-wave | 2017 | T1 | 1703.04716 |
| 0.4 | — | single_crystal | resistivity | — | 2011 | T1 | 1101.3750 |
| 0.4 | — | single_crystal | resistivity | — | 2014 | T1 | DOI: 10.1103/PhysRevB.89.020508 |
| 0.4 | — | thin_film | resistivity | — | 2012 | T1 | DOI: 10.1103/PhysRevB.86.085121 |
| 0.4 | — | thin_film | resistivity | — | 2011 | — | 1106.5193 |
| 0.4 | — | thin_film | resistivity | — | 2024 | T3 | 2402.14051 |
| 0.4 | — | thin_film | resistivity | — | 2016 | T1 | 1611.07763 |
| 0.4 | — | single_crystal | resistivity | — | 2025 | T1 | DOI: 10.1103/PhysRevB.111.054522 |
| 0.4 | — | thin_film | resistivity | — | 2018 | T1 | 1810.08069 |
| 0.3 | — | — | — | — | 2022 | T1 | 2210.05753 |
| 0.3 | — | thin_film | resistivity | — | 2010 | T3 | 1001.0781 |
| 0.3 | — | thin_film | resistivity | — | 2013 | T1 | DOI: 10.1103/PhysRevB.88.241104 |
| 0.3 | — | thin_film | resistivity | — | 2013 | T1 | 1308.2215 |
| 0.3 | — | thin_film | resistivity | — | 2020 | T1 | 2007.01110 |
| 0.3 | — | thin_film | resistivity | — | 2021 | T1 | DOI: 10.1103/PhysRevLett.126.077001 |
| 0.3 | — | single_crystal | resistivity | — | 2014 | T1 | DOI: 10.1103/PhysRevB.89.020508 |
| 0.3 | — | single_crystal | resistivity | — | 2025 | T1 | DOI: 10.1103/PhysRevB.111.054522 |
| 0.3 | — | thin_film | resistivity | s-wave | 2018 | T1 | DOI: 10.1103/PhysRevLett.121.167003 |
| 0.3 | — | thin_film | resistivity | s-wave | 2013 | T3 | 1311.2323 |
| 0.3 | — | thin_film | resistivity | — | 2010 | — | 1002.3737 |
| 0.3 | — | single_crystal | resistivity | — | 2025 | T1 | DOI: 10.1103/PhysRevB.111.054522 |
| 0.3 | — | — | resistivity | s-wave | 2017 | T1 | 1703.04716 |
| 0.3 | — | thin_film | resistivity | s-wave | 2013 | T3 | 1311.2323 |
| 0.3 | — | thin_film | resistivity | — | 2010 | T3 | 1001.0781 |
| 0.3 | — | thin_film | resistivity | — | 2010 | — | 1002.3737 |
| 0.3 | — | — | — | — | 2006 | — | cond-mat/0604509 |
| 0.3 | — | thin_film | resistivity | — | 2005 | T1 | cond-mat/0508073 |
| 0.2 | — | single_crystal | resistivity | — | 2002 | T1 | cond-mat/0212649 |
| 0.2 | — | thin_film | resistivity | — | 2021 | T1 | DOI: 10.1103/PhysRevMaterials.5.104801 |
| 0.2 | — | thin_film | resistivity | — | 2014 | T3 | 1402.4646 |
| 0.2 | — | — | resistivity | — | 2021 | — | 2110.07230 |
| 0.2 | — | thin_film | resistivity | — | 2011 | T2 | 1112.2633 |
| 0.2 | — | thin_film | resistivity | — | 2005 | T1 | DOI: 10.1103/PhysRevB.72.094520 |
| 0.2 | — | thin_film | resistivity | — | 2013 | T2 | 1305.2411 |
| 0.2 | — | thin_film | resistivity | — | 2013 | T1 | 1308.2215 |
| 0.2 | — | thin_film | resistivity | — | 2010 | T3 | 1001.0781 |
| 0.2 | — | thin_film | resistivity | — | 2013 | T2 | 1305.2411 |
| 0.1 | — | thin_film | resistivity | — | 2010 | T3 | 1001.0781 |
| 0.1 | — | thin_film | resistivity | — | 2010 | T3 | 1001.0781 |
| 0.1 | — | thin_film | susceptibility | — | 2018 | T1 | 1805.08549 |
| 0.1 | — | single_crystal | resistivity | — | 2019 | T1 | 1904.03121 |
| 0.1 | — | thin_film | resistivity | — | 2013 | T2 | 1305.2411 |
| 0.1 | — | single_crystal | resistivity | — | 2002 | T1 | cond-mat/0212649 |
| 0.1 | — | thin_film | susceptibility | — | 2018 | T1 | 1805.08549 |
| 0.1 | — | single_crystal | resistivity | — | 2019 | T1 | 1904.03121 |
| 0.0 | — | thin_film | resistivity | — | 2013 | T2 | 1305.2411 |
| — | — | — | — | d-wave | 2026 | T2 | 2602.17996 |
| — | — | — | — | — | 2025 | — | 2503.10372 |
| — | — | — | — | — | 2025 | T1 | 2509.10881 |
| — | — | — | — | — | 2024 | — | 2412.05374 |
| — | — | thin_film | resistivity | — | 2023 | T1 | 2303.16238 |
| — | — | — | — | — | 2023 | T1 | DOI: 10.1103/PhysRevResearch.5.023177 |
| — | — | single_crystal | resistivity | — | 2023 | T1 | DOI: 10.1103/PhysRevResearch.5.033080 |
| — | — | — | resistivity | s_pm | 2021 | T1 | 2104.08220 |
| — | — | — | STM, resistivity | s-wave | 2021 | T2 | 2106.10802 |
| — | — | — | resistivity | — | 2021 | — | 2107.10904 |
| — | — | — | — | s-wave | 2021 | T3 | 2106.09530 |
| — | — | thin_film | resistivity | — | 2021 | T3 | 2102.07239 |
| — | — | — | — | — | 2021 | T3 | 2106.11295 |
| — | — | single_crystal | — | — | 2021 | T1 | DOI: 10.1103/PhysRevB.103.214511 |
| — | — | — | — | s-wave | 2021 | T1 | DOI: 10.1103/PhysRevB.104.L220506 |
| — | — | thin_film | resistivity | — | 2020 | — | 2003.10586 |
| — | — | single_crystal | — | — | 2020 | T1 | 2005.00514 |
| — | — | single_crystal | resistivity | — | 2019 | T1 | 1904.03121 |
| — | — | — | — | — | 2019 | T3 | 1907.11079 |
| — | — | — | — | — | 2019 | T1 | 1910.14346 |
| — | — | — | susceptibility, resistivity | — | 2019 | T1 | 1907.01733 |
| — | — | thin_film | susceptibility | — | 2018 | — | 1806.00617 |
| — | — | — | resistivity | — | 2018 | — | 1809.04246 |
| — | — | thin_film | susceptibility | — | 2018 | T1 | DOI: 10.1103/PhysRevB.98.064510 |
| — | — | thin_film | — | — | 2018 | T3 | 1812.02875 |
| — | — | — | — | d-wave | 2018 | T1 | 1803.06993 |
| — | — | — | — | — | 2018 | T1 | 1808.03739 |
| — | — | — | — | — | 2018 | T3 | 1811.11656 |
| — | — | — | resistivity | — | 2018 | T1 | 1801.02881 |
| — | — | thin_film | resistivity | — | 2017 | T3 | 1706.01717 |
| — | — | — | — | — | 2016 | T3 | 1606.00644 |
| — | — | thin_film | STM | s-wave | 2016 | T1 | 1608.05621 |
| — | — | thin_film | susceptibility | — | 2016 | T1 | 1605.08418 |
| — | — | — | — | unknown | 2015 | T3 | 1505.00790 |
| — | — | — | — | unknown | 2015 | T3 | 1508.00529 |
| — | — | single_crystal | resistivity | — | 2014 | T1 | 1401.4278 |
| — | — | single_crystal | resistivity | — | 2013 | T1 | DOI: 10.1103/PhysRevX.3.021002 |
| — | — | — | Nernst | — | 2012 | — | 1211.4761 |
| — | — | single_crystal | susceptibility | — | 2012 | T1 | DOI: 10.1103/PhysRevB.85.224518 |
| — | — | thin_film | susceptibility | — | 2012 | T1 | 1204.3355 |
Structure
- Crystal structure
- tetragonal
- Space group
- I4/mcm (#140)
- Lattice a (Å)
- 3.905
Superconducting parameters
- Pairing symmetry
- s-wave
- Gap structure
- full_gap
- Hc2
- 2.2 T (at R_N/2)
- λ_eph (e–ph coupling)
- 0.21
- ω_log
- 35 K
Competing orders
- ρ(T) exponent
- 2.00
Samples & pressure
- Sample form
- thin_film
- Substrate
- SrTiO3
- Pressure type
- none
- Doping type
- electron
- Doping level
- 0.010