Tc max
4.5 K
Tc ambient
4.5 K
arXiv year
1987
Papers
74
Tc exp.
4.5 K
Tc theo.
4.4 K
Evidence
experimental
Tc max measured at resistivity, arXiv:1408.4727, confirmed by 2 papers
Evidence (97 records from 74 papers)
the flat columns above are aggregates — each line here is one paper's claim| Tc (K) | P (GPa) | Sample | Method | Pairing | Year | Tier | Paper |
|---|---|---|---|---|---|---|---|
| 4.8 | ambient | polycrystal | resistivity | — | 2015 | T1 | 1512.00684 |
| 4.5 | — | — | resistivity | — | 2014 | T1 | 1408.4727 |
| 4.5 | ambient | single_crystal | susceptibility | — | 2026 | T1 | DOI: 10.1103/jwy8-cqcm |
| 4.5 | — | polycrystal | resistivity | — | 2023 | T1 | DOI: 10.1103/PhysRevMaterials.7.064802 |
| 4.4 | — | thin_film | resistivity | — | 2010 | T1 | 1005.0408 |
| 4.4 | — | thin_film | resistivity | — | 2008 | T1 | 0802.0640 |
| 4.4 | — | thin_film | resistivity | — | 2008 | T1 | DOI: 10.1103/PhysRevLett.100.257002 |
| 4.4 | — | — | — | — | 2026 | T2 | 2603.05123 |
| 4.4 | — | thin_film | resistivity, susceptibility | — | 2005 | T1 | DOI: 10.1103/PhysRevB.72.024506 |
| 4.4 | — | thin_film | resistivity, susceptibility | — | 2005 | T1 | cond-mat/0504626 |
| 4.4 | — | — | — | — | 2013 | T1 | 1303.7151 |
| 4.4 | — | thin_film | resistivity | — | 2009 | T1 | DOI: 10.1103/PhysRevB.79.020509 |
| 4.4 | — | thin_film | resistivity | — | 2008 | T1 | 0811.1961 |
| 4.4 | — | thin_film | resistivity | — | 2025 | — | 2503.03168 |
| 4.4 | — | thin_film | resistivity | — | 2025 | T1 | DOI: 10.1103/PhysRevB.111.184503 |
| 4.3 | — | thin_film | resistivity | — | 2025 | — | 2503.03168 |
| 4.3 | — | thin_film | resistivity | — | 2025 | — | 2503.03168 |
| 4.3 | — | thin_film | resistivity | — | 2025 | — | 2503.03168 |
| 4.2 | — | thin_film | resistivity | — | 2025 | — | 2503.03168 |
| 4.2 | — | thin_film | resistivity | — | 2025 | T1 | DOI: 10.1103/PhysRevB.111.184503 |
| 4.1 | — | thin_film | resistivity | — | 2025 | T1 | DOI: 10.1103/PhysRevApplied.23.034025 |
| 4.1 | — | thin_film | resistivity | — | 2024 | T1 | 2405.12417 |
| 3.9 | — | thin_film | resistivity | — | 2025 | T1 | DOI: 10.1103/PhysRevB.111.184503 |
| 3.6 | — | thin_film | resistivity | — | 2025 | T1 | DOI: 10.1103/PhysRevB.111.184503 |
| 3.3 | — | thin_film | resistivity | — | 2025 | T1 | DOI: 10.1103/PhysRevB.111.184503 |
| 2.5 | — | thin_film | resistivity | — | 2009 | T1 | DOI: 10.1103/PhysRevB.79.165436 |
| 2.2 | — | thin_film | resistivity | — | 2025 | T1 | DOI: 10.1103/PhysRevB.111.184503 |
| 1.5 | ambient | — | resistivity | — | 2014 | T1 | 1410.7342 |
| 1.4 | — | thin_film | resistivity | — | 1994 | T1 | DOI: 10.1103/PhysRevB.50.13622 |
| 1.3 | — | — | resistivity | — | 2024 | T1 | 2409.19052 |
| 1.2 | — | thin_film | resistivity | — | 2014 | T1 | 1408.5679 |
| 1.0 | — | thin_film | resistivity | — | 2022 | T1 | 2207.05534 |
| 1.0 | — | thin_film | resistivity | — | 2014 | T1 | 1408.5679 |
| 1.0 | — | thin_film | resistivity | — | 2006 | T1 | cond-mat/0606012 |
| 0.9 | — | thin_film | resistivity | — | 2020 | T1 | 2009.03511 |
| 0.9 | — | thin_film | resistivity | — | 1996 | T1 | DOI: 10.1103/PhysRevB.53.15226 |
| 0.8 | — | thin_film | resistivity | — | 2020 | T1 | 2009.03511 |
| 0.8 | — | thin_film | resistivity | — | 2006 | T1 | cond-mat/0606012 |
| 0.7 | — | thin_film | resistivity | — | 2021 | T1 | DOI: 10.1103/PhysRevApplied.16.014019 |
| 0.7 | — | thin_film | resistivity | — | 2006 | T1 | DOI: 10.1103/PhysRevB.74.100507 |
| 0.7 | — | thin_film | resistivity | — | 2006 | T1 | cond-mat/0606012 |
| 0.7 | — | thin_film | resistivity | — | 2015 | T1 | 1502.03173 |
| 0.7 | — | thin_film | resistivity | — | 2009 | T1 | 0906.0629 |
| 0.6 | — | thin_film | resistivity | — | 2006 | T1 | cond-mat/0606012 |
| 0.6 | — | thin_film | resistivity | — | 2006 | T1 | cond-mat/0606012 |
| 0.5 | — | thin_film | resistivity | — | 2015 | T1 | 1502.03173 |
| 0.4 | — | thin_film | resistivity | — | 2020 | T1 | DOI: 10.1103/PhysRevB.102.184501 |
| 0.4 | — | thin_film | resistivity | — | 2020 | T1 | DOI: 10.1103/PhysRevB.102.184501 |
| 0.4 | — | thin_film | resistivity | — | 2015 | T1 | 1502.03173 |
| 0.3 | — | thin_film | resistivity | — | 2020 | T1 | DOI: 10.1103/PhysRevB.102.184501 |
| 0.3 | — | thin_film | resistivity | — | 2020 | T1 | DOI: 10.1103/PhysRevB.102.184501 |
| 0.3 | — | thin_film | resistivity | — | 2015 | T1 | 1502.03173 |
| 0.3 | — | thin_film | resistivity | — | 2009 | T1 | 0906.0629 |
| 0.2 | — | thin_film | resistivity | — | 2006 | T1 | DOI: 10.1103/PhysRevB.73.100505 |
| 0.2 | — | thin_film | resistivity | — | 2006 | T1 | DOI: 10.1103/PhysRevB.74.100507 |
| — | — | thin_film | resistivity | — | 2026 | T1 | DOI: 10.1103/tw65-82r9 |
| — | ambient | — | — | — | 2026 | T2 | 2601.13292 |
| — | — | thin_film | susceptibility | s-wave | 2026 | T2 | 2603.06802 |
| — | — | — | — | — | 2025 | — | 2503.08767 |
| — | — | thin_film | resistivity | — | 2025 | T1 | DOI: 10.1103/PhysRevB.111.054506 |
| — | — | single_crystal | STM | — | 2025 | — | 2506.16869 |
| — | — | thin_film | — | — | 2025 | T3 | 2507.12141 |
| — | — | thin_film | resistivity | — | 2025 | T1 | 2509.07669 |
| — | — | thin_film | STM | — | 2024 | — | 2412.15903 |
| — | — | thin_film | — | — | 2024 | — | 2412.16099 |
| — | — | single_crystal | STM | s-wave | 2024 | T1 | 2405.14673 |
| — | — | single_crystal | STM | s-wave | 2023 | T1 | DOI: 10.1103/PhysRevB.107.024426 |
| — | — | thin_film | resistivity | — | 2023 | T1 | DOI: 10.1103/PhysRevX.13.041005 |
| — | — | single_crystal | resistivity | — | 2023 | T1 | 2306.02441 |
| — | — | — | resistivity | — | 2022 | T3 | 2201.10425 |
| — | — | thin_film | resistivity | — | 2020 | — | 2007.11923 |
| — | — | — | resistivity | — | 2019 | T3 | 1906.04380 |
| — | — | — | — | — | 2019 | T1 | 1912.10794 |
| — | — | — | resistivity | — | 2016 | T1 | 1602.04356 |
| — | — | — | resistivity | — | 2015 | T1 | 1512.06416 |
| — | — | thin_film | resistivity | — | 2015 | T1 | 1505.06191 |
| — | — | thin_film | resistivity | — | 2014 | T1 | 1401.3947 |
| — | — | — | resistivity | — | 2013 | T1 | 1309.5331 |
| — | — | thin_film | resistivity | — | 2012 | T1 | 1203.6296 |
| — | — | — | — | — | 2012 | T1 | 1207.6486 |
| — | — | thin_film | resistivity | — | 2010 | T1 | DOI: 10.1103/PhysRevB.81.020505 |
| — | — | wire | resistivity | — | 2008 | T1 | DOI: 10.1103/PhysRevB.78.045414 |
| — | — | — | STM | — | 2007 | T2 | cond-mat/0703089 |
| — | — | thin_film | susceptibility | — | 2006 | T1 | cond-mat/0610130 |
| — | — | thin_film | resistivity | — | 2006 | T1 | DOI: 10.1103/PhysRevLett.97.057005 |
| — | — | thin_film | resistivity | — | 2006 | T3 | cond-mat/0601460 |
| — | — | — | — | — | 2005 | T1 | DOI: 10.1103/PhysRevB.72.024546 |
| — | — | thin_film | resistivity | — | 2005 | T1 | cond-mat/0504340 |
| — | — | wire | resistivity | — | 2004 | T1 | DOI: 10.1103/PhysRevB.69.134507 |
| — | — | thin_film | resistivity | — | 2001 | T1 | DOI: 10.1103/PhysRevB.63.214507 |
| — | — | thin_film | — | — | 2000 | T1 | DOI: 10.1103/PhysRevB.61.9719 |
| — | — | polycrystal | resistivity | — | 1999 | T1 | DOI: 10.1103/PhysRevB.59.14606 |
| — | 45.0 | polycrystal | susceptibility | — | 1997 | T1 | DOI: 10.1103/PhysRevLett.79.4262 |
| — | — | single_crystal | resistivity | — | 1996 | T1 | DOI: 10.1103/PhysRevB.54.6545 |
| — | — | single_crystal | resistivity | — | 1995 | T1 | DOI: 10.1103/PhysRevB.51.3660 |
| — | — | wire | resistivity | — | 1994 | T1 | DOI: 10.1103/PhysRevB.50.16741 |
| — | — | wire | resistivity | — | 1987 | T1 | DOI: 10.1103/PhysRevB.35.4669 |
Structure
- Crystal structure
- amorphous
- Lattice a (Å)
- 3.313
Superconducting parameters
- Pairing symmetry
- s-wave
- Gap structure
- full_gap
- Hc2
- 2.0 T (0 K)
- λ_eph (e–ph coupling)
- 0.15
Samples & pressure
- Sample form
- thin_film
- Substrate
- sapphire
- Pressure type
- none
- Doping type
- none
- Doping level
- 0.000