Tc max
3.0 K
Tc ambient
2.7 K
arXiv year
1996
Papers
2
Tc exp.
3.0 K
Tc theo.
—
Evidence
experimental
Tc max measured at thin_film, resistivity, DOI: 10.1103/PhysRevB.53.15226
Evidence (3 records from 2 papers)
the flat columns above are aggregates — each line here is one paper's claim| Tc (K) | P (GPa) | Sample | Method | Pairing | Year | Tier | Paper |
|---|---|---|---|---|---|---|---|
| 3.0 | — | thin_film | resistivity | — | 1996 | T1 | DOI: 10.1103/PhysRevB.53.15226 |
| 2.7 | — | thin_film | resistivity | — | 1997 | T1 | DOI: 10.1103/PhysRevLett.78.3378 |
| 1.7 |
Superconducting parameters
- λ_eph (e–ph coupling)
- —
Samples & pressure
- Sample form
- thin_film
- Substrate
- glass