Tc max
6.4 K
Tc ambient
5.0 K
arXiv year
2010
Papers
4
Tc exp.
6.4 K
Tc theo.
—
Evidence
experimental
Tc max measured at thin_film, resistivity, DOI: 10.1103/PhysRevB.96.134522
Evidence (10 records from 4 papers)
the flat columns above are aggregates — each line here is one paper's claim| Tc (K) | P (GPa) | Sample | Method | Pairing | Year | Tier | Paper |
|---|---|---|---|---|---|---|---|
| 6.4 | — | thin_film | resistivity | — | 2017 | T1 | DOI: 10.1103/PhysRevB.96.134522 |
| 5.0 | — | thin_film | resistivity | — | 2014 | T1 | 1403.3507 |
| 3.7 | — |
Superconducting parameters
- λ_eph (e–ph coupling)
- —
Samples & pressure
- Sample form
- thin_film
- Substrate
- Si
- Doping type
- none