Tc max
3.7 K
Tc ambient
3.0 K
arXiv year
2008
Papers
35
Tc exp.
3.7 K
Tc theo.
3.1 K
Evidence
experimental
Tc max measured at P=15 GPa, single_crystal, resistivity, DOI: 10.1103/PhysRevB.97.220504, confirmed by 2 papers
Evidence (48 records from 35 papers)
the flat columns above are aggregates — each line here is one paper's claim| Tc (K) | P (GPa) | Sample | Method | Pairing | Year | Tier | Paper |
|---|---|---|---|---|---|---|---|
| 5.1 | — | thin_film | resistivity | — | 2017 | — | 1711.00468 |
| 3.7 | 15.0 | single_crystal | resistivity | — | 2018 | T1 | DOI: 10.1103/PhysRevB.97.220504 |
| 3.6 | — | wire | resistivity | — | 2025 | T2 | 2507.15792 |
| 3.6 | — | — | — | — | 2022 | — | 2206.11665 |
| 3.5 | — | single_crystal | resistivity | — | 2022 | T2 | 2206.00281 |
| 3.4 | — | thin_film | resistivity | — | 2018 | T1 | DOI: 10.1103/PhysRevB.98.035203 |
| 3.2 | — | thin_film | resistivity | — | 2017 | T1 | 1712.07763 |
| 3.1 | — | thin_film | — | unknown | 2022 | T1 | DOI: 10.1103/PhysRevB.105.L180505 |
| 3.0 | — | thin_film | resistivity | — | 2025 | T1 | 2510.24627 |
| 3.0 | — | thin_film | resistivity | — | 2018 | T1 | DOI: 10.1103/PhysRevB.98.035203 |
| 3.0 | — | thin_film | resistivity | — | 2017 | — | 1711.00468 |
| 3.0 | — | single_crystal | resistivity, STM | — | 2014 | T1 | 1406.6234 |
| 2.9 | ambient | single_crystal | susceptibility | — | 2010 | T2 | 1004.3251 |
| 2.7 | — | — | STM | — | 2021 | T3 | 2112.10240 |
| 2.6 | — | — | — | — | 2022 | — | 2206.11665 |
| 2.5 | — | thin_film | resistivity | — | 2018 | T1 | DOI: 10.1103/PhysRevB.98.035203 |
| 2.4 | — | single_crystal | specific_heat | — | 2022 | T2 | 2206.00281 |
| 2.4 | 1.5 | single_crystal | resistivity | — | 2018 | T1 | DOI: 10.1103/PhysRevB.97.220504 |
| 2.2 | — | — | resistivity | — | 2016 | T1 | 1604.05656 |
| 2.1 | ambient | single_crystal | resistivity, susceptibility | — | 2010 | T2 | 1004.3251 |
| 2.0 | — | thin_film | resistivity | — | 2018 | T1 | DOI: 10.1103/PhysRevB.98.035203 |
| 1.9 | 5.0 | single_crystal | resistivity | — | 2018 | T1 | DOI: 10.1103/PhysRevB.97.220504 |
| 1.8 | — | — | STM | — | 2011 | T1 | 1107.3571 |
| 1.6 | — | thin_film | resistivity | — | 2018 | T1 | DOI: 10.1103/PhysRevB.98.035203 |
| 1.2 | — | single_crystal | resistivity | — | 2021 | T1 | DOI: 10.1103/PhysRevB.104.064511 |
| 1.2 | ambient | — | susceptibility | s-wave | 2020 | T1 | DOI: 10.1103/PhysRevLett.125.186401 |
| 0.9 | — | single_crystal | resistivity | — | 2018 | T1 | DOI: 10.1103/PhysRevB.98.035203 |
| 0.8 | — | — | resistivity | — | 2024 | T1 | 2409.13384 |
| 0.8 | — | single_crystal | susceptibility | — | 2023 | T1 | DOI: 10.1103/PhysRevB.108.075103 |
| 0.5 | — | — | resistivity | — | 2016 | T1 | 1604.05656 |
| — | — | thin_film | STM | s-wave | 2026 | T1 | 2603.05759 |
| — | — | — | — | p-wave | 2025 | T2 | 2509.05784 |
| — | — | — | susceptibility | — | 2025 | T2 | 2510.25124 |
| — | — | — | — | unknown | 2025 | T1 | 2512.18051 |
| — | — | — | resistivity | — | 2024 | T1 | 2407.21427 |
| — | — | thin_film | — | unknown | 2024 | T3 | 2407.13121 |
| — | — | — | — | — | 2024 | T1 | 2407.10352 |
| — | — | — | — | — | 2023 | — | 2311.07153 |
| — | — | — | resistivity | — | 2023 | T2 | 2302.05078 |
| — | — | single_crystal | resistivity, STM | unknown | 2022 | T3 | 2208.14442 |
| — | — | — | STM | — | 2022 | — | 2205.11818 |
| — | — | thin_film | STM | unknown | 2021 | T1 | 2112.07316 |
| — | — | — | — | unknown | 2019 | T1 | 1904.00408 |
| — | 8.5 | — | — | — | 2018 | T1 | 1806.03433 |
| — | — | thin_film | resistivity | — | 2017 | — | 1711.00468 |
| — | — | — | specific_heat | — | 2017 | T1 | 1703.09850 |
| — | — | — | — | p-wave | 2016 | T1 | 1604.02867 |
| — | — | — | — | — | 2008 | T1 | 0808.2147 |
Structure
- Crystal structure
- CdI2-type
- Space group
- P3-m1
- Lattice a (Å)
- 3.340
- Lattice c (Å)
- 35.850
Superconducting parameters
- Pairing symmetry
- s-wave
- Hc2
- 34.5 T (out of plane magnetic fields)
- λ_eph (e–ph coupling)
- 0.79
Competing orders
- Competing order
- CDW
- T_CDW
- 78.0 K
- T_AFM
- 30.0 K
- ρ(T) exponent
- 2.45
Samples & pressure
- Substrate
- HOPG
- Pressure type
- none
- Doping type
- none