Tc max
0.2 K
Tc ambient
0.2 K
arXiv year
2023
Papers
1
Tc max measured at thin_film, resistivity, arXiv:2303.09052
Evidence (4 records from 1 paper)
the flat columns above are aggregates — each line here is one paper's claim| Tc (K) | P (GPa) | Sample | Method | Pairing | Year | Tier | Paper |
|---|---|---|---|---|---|---|---|
| 0.2 | — | thin_film | resistivity | — | 2023 | — | 2303.09052 |
| 0.2 | — | thin_film | resistivity | — | 2023 | — | 2303.09052 |
| 0.1 | — | thin_film | resistivity | — | 2023 | — | 2303.09052 |
Superconducting parameters
- Hc2
- 0.0 T (out-of-plane, half of the normal state resistance recovered)
- λ_eph (e–ph coupling)
- —
Samples & pressure
- Substrate
- Si substrate capped with a 285 thick SiO_2 layer