Tc max
0.4 K
Tc ambient
0.4 K
arXiv year
1990
Papers
27
Tc exp.
0.5 K
Tc theo.
—
Evidence
experimental
Tc max measured at thin_film, resistivity, DOI: 10.1103/PhysRevLett.101.077004, confirmed by 3 papers
Evidence (32 records from 27 papers)
the flat columns above are aggregates — each line here is one paper's claim| Tc (K) | P (GPa) | Sample | Method | Pairing | Year | Tier | Paper |
|---|---|---|---|---|---|---|---|
| 0.5 | — | thin_film | resistivity | — | 2019 | T1 | DOI: 10.1103/PhysRevApplied.11.024061 |
| 0.5 | — | — | resistivity | — | 2018 | — | 1803.02736 |
| 0.5 | — | thin_film | resistivity |
Structure
- Crystal structure
- hcp
Superconducting parameters
- λ_eph (e–ph coupling)
- 0.58
Samples & pressure
- Sample form
- thin_film
- Substrate
- Si/SiO2
- Pressure type
- none