Tc max
0.4 K
Tc ambient
0.4 K
arXiv year
1990
Papers
27
Tc exp.
0.5 K
Tc theo.
—
Evidence
experimental
Tc max measured at resistivity, arXiv:1803.02736, confirmed by 3 papers
Evidence (32 records from 27 papers)
the flat columns above are aggregates — each line here is one paper's claim| Tc (K) | P (GPa) | Sample | Method | Pairing | Year | Tier | Paper |
|---|---|---|---|---|---|---|---|
| 0.5 | — | thin_film | resistivity | — | 2019 | T1 | DOI: 10.1103/PhysRevApplied.11.024061 |
| 0.5 | — | — | resistivity | — | 2018 | — | 1803.02736 |
| 0.5 | — | thin_film | resistivity | — | 2008 | T1 | DOI: 10.1103/PhysRevLett.101.077004 |
| 0.5 | — | polycrystal | resistivity | s-wave | 2018 | T1 | DOI: 10.1103/PhysRevB.97.214516 |
| 0.5 | — | — | resistivity | — | 2017 | T1 | 1710.02400 |
| 0.5 | — | — | resistivity | — | 2018 | — | 1803.02736 |
| 0.5 | — | polycrystal | resistivity | s-wave | 2018 | T1 | DOI: 10.1103/PhysRevB.97.214516 |
| 0.4 | — | thin_film | resistivity | — | 2019 | T1 | 1904.08349 |
| 0.4 | — | polycrystal | resistivity | — | 2000 | T1 | DOI: 10.1103/PhysRevB.62.8695 |
| 0.4 | — | thin_film | resistivity | — | 2012 | T1 | 1209.4626 |
| 0.4 | — | thin_film | resistivity | — | 2011 | T1 | 1106.3852 |
| 0.3 | — | thin_film | resistivity | — | 2021 | T1 | 2102.10699 |
| 0.3 | — | — | STM | — | 2020 | T1 | 2005.00584 |
| 0.3 | ambient | thin_film | resistivity | — | 2020 | T1 | DOI: 10.1103/PhysRevApplied.13.054026 |
| 0.3 | — | thin_film | resistivity | — | 2021 | T1 | 2107.01567 |
| 0.3 | — | — | resistivity | — | 2009 | T1 | 0906.0715 |
| 0.2 | — | thin_film | resistivity | — | 2020 | T1 | 2005.00462 |
| 0.2 | — | thin_film | resistivity | — | 2008 | T1 | DOI: 10.1103/PhysRevLett.101.077004 |
| 0.2 | — | thin_film | resistivity | — | 2021 | T1 | 2107.01567 |
| 0.2 | — | thin_film | resistivity | — | 2012 | T1 | 1207.2329 |
| 0.1 | — | thin_film | resistivity | — | 2003 | T1 | DOI: 10.1103/PhysRevLett.90.238306 |
| 0.1 | — | thin_film | resistivity | — | 2012 | T1 | 1207.2329 |
| — | ambient | — | — | — | 2026 | T2 | 2601.13292 |
| — | 180.0 | — | susceptibility | — | 2025 | T1 | 2510.26605 |
| — | — | thin_film | resistivity | — | 2025 | T1 | DOI: 10.1103/78vl-znpj |
| — | ambient | thin_film | resistivity | — | 2023 | T1 | 2306.00685 |
| — | — | — | — | — | 2022 | T1 | 2202.11656 |
| — | — | — | resistivity | — | 2021 | — | 2102.00215 |
| — | — | thin_film | resistivity | — | 2019 | T1 | 1907.08071 |
| — | — | wire | resistivity | — | 2016 | T1 | 1602.07930 |
| — | — | thin_film | resistivity | — | 2012 | T1 | 1209.4259 |
| — | — | thin_film | — | — | 1990 | T1 | DOI: 10.1103/PhysRevLett.64.2172 |
Structure
- Crystal structure
- hcp
Superconducting parameters
- λ_eph (e–ph coupling)
- 0.58
Samples & pressure
- Sample form
- thin_film
- Substrate
- Si/SiO2
- Pressure type
- none