Tc max
1.1 K
Tc ambient
—
arXiv year
2009
Papers
8
Tc exp.
1.1 K
Tc theo.
—
Evidence
experimental
Tc max measured at thin_film, resistivity, DOI: 10.1103/PhysRevLett.110.076803, confirmed by 4 papers
Overlayer
ti
Substrate
al
Evidence (8 records from 8 papers)
the flat columns above are aggregates — each line here is one paper's claim| Tc (K) | P (GPa) | Sample | Method | Pairing | Year | Tier | Paper |
|---|---|---|---|---|---|---|---|
| 1.1 | — | thin_film | resistivity | — | 2013 | T1 | DOI: 10.1103/PhysRevLett.110.076803 |
| 1.0 | — | thin_film | resistivity | — | 2022 | T1 | DOI: 10.1103/PhysRevB.106.L180507 |
| 1.0 | — | thin_film | resistivity | — | 2015 | T1 | DOI: 10.1103/PhysRevB.91.245418 |
| 1.0 | — | thin_film | resistivity | — | 2009 | T1 | DOI: 10.1103/PhysRevB.79.161407 |
| — | — | thin_film | resistivity | — | 2019 | T1 | DOI: 10.1103/PhysRevB.100.165416 |
| — | — | thin_film | resistivity | — | 2016 | T1 | DOI: 10.1103/PhysRevB.94.115405 |
| — | — | thin_film | resistivity | — | 2016 | T1 | DOI: 10.1103/PhysRevB.94.115435 |
| — | — | thin_film | resistivity | — | 2010 | T1 | DOI: 10.1103/PhysRevLett.104.246804 |
Superconducting parameters
- λ_eph (e–ph coupling)
- —
Samples & pressure
- Sample form
- thin_film
- Substrate
- InAs