Tc max
0.1 K
Tc ambient
0.1 K
arXiv year
2011
Papers
6
Tc exp.
0.1 K
Tc theo.
—
Evidence
experimental
Tc max measured at thin_film, resistivity, DOI: 10.1103/PhysRevApplied.18.024066, confirmed by 2 papers
Overlayer
ti
Substrate
au
Evidence (7 records from 6 papers)
the flat columns above are aggregates — each line here is one paper's claim| Tc (K) | P (GPa) | Sample | Method | Pairing | Year | Tier | Paper |
|---|---|---|---|---|---|---|---|
| 0.1 | — | thin_film | resistivity | — | 2011 | — | 1112.0400 |
| 0.1 | — | thin_film | resistivity | — | 2022 | T1 | DOI: 10.1103/PhysRevApplied.18.024066 |
| 0.1 | — | thin_film | resistivity | — | 2022 | T1 | DOI: 10.1103/PhysRevApplied.18.024066 |
| 0.1 | — | thin_film | resistivity | — | 2024 | T1 | 2402.03073 |
| 0.1 | — | thin_film | resistivity | — | 2024 | T1 | DOI: 10.1103/PhysRevApplied.22.024051 |
| 0.1 | — | thin_film | resistivity | — | 2021 | T1 | DOI: 10.1103/PhysRevLett.126.217001 |
| 0.1 | ambient | thin_film | resistivity | — | 2016 | T3 | 1604.00549 |
Superconducting parameters
- λ_eph (e–ph coupling)
- —
Samples & pressure
- Sample form
- thin_film
- Substrate
- silicon