Tc max
6.2 K
Tc ambient
6.2 K
arXiv year
2023
Papers
3
Tc exp.
6.2 K
Tc theo.
—
Evidence
experimental
Tc max measured at ambient, thin_film, resistivity, arXiv:2308.02303, confirmed by 2 papers
Evidence (4 records from 3 papers)
the flat columns above are aggregates — each line here is one paper's claim| Tc (K) | P (GPa) | Sample | Method | Pairing | Year | Tier | Paper |
|---|---|---|---|---|---|---|---|
| 6.2 | ambient | thin_film | resistivity | — | 2023 | — | 2308.02303 |
| 5.7 | — | thin_film | — | — | 2025 | T1 | 2512.20242 |
| 5.2 | ambient | thin_film | resistivity | — | 2023 | — | 2308.02303 |
| — | — | thin_film | resistivity | — | 2025 | — | 2501.00812 |
Superconducting parameters
- λ_eph (e–ph coupling)
- —
Samples & pressure
- Sample form
- thin_film
- Substrate
- SiO2-coated Si
- Pressure type
- none