Tc max
0.8 K
Tc ambient
—
arXiv year
2016
Papers
1
Tc max measured at thin_film, resistivity, arXiv:1601.01466
Evidence (1 record from 1 paper)
the flat columns above are aggregates — each line here is one paper's claim| Tc (K) | P (GPa) | Sample | Method | Pairing | Year | Tier | Paper |
|---|---|---|---|---|---|---|---|
| 0.8 | — | thin_film | resistivity | — | 2016 | — | 1601.01466 |
Superconducting parameters
- λ_eph (e–ph coupling)
- —
Samples & pressure
- Sample form
- thin_film
- Substrate
- Si(100)