Tc max
5.6 K
Tc ambient
5.5 K
arXiv year
1999
Papers
77
Tc exp.
5.6 K
Tc theo.
17.0 K
Evidence
experimental
Tc max measured at thin_film, resistivity, arXiv:1903.05009, confirmed by 3 papers
Evidence (131 records from 77 papers)
the flat columns above are aggregates — each line here is one paper's claim| Tc (K) | P (GPa) | Sample | Method | Pairing | Year | Tier | Paper |
|---|---|---|---|---|---|---|---|
| 17.0 | — | — | — | — | 2025 | — | 2503.03559 |
| 16.0 | — | — | — | — | 2025 | — | 2503.03559 |
| 5.7 | ambient | thin_film | resistivity | — | 2025 | T1 | DOI: 10.1103/vk73-drrn |
| 5.6 | — | thin_film | resistivity | — | 2019 | T1 | 1903.05009 |
| 5.6 | — | thin_film | resistivity | — | 2019 | T1 | DOI: 10.1103/PhysRevApplied.12.054001 |
| 5.5 | ambient | thin_film | resistivity | — | 2025 | T1 | DOI: 10.1103/vk73-drrn |
| 5.5 | — | thin_film | resistivity | — | 2024 | T1 | 2410.17588 |
| 5.5 | ambient | thin_film | resistivity | — | 2025 | T1 | DOI: 10.1103/vk73-drrn |
| 5.3 | ambient | thin_film | resistivity | — | 2025 | T1 | DOI: 10.1103/vk73-drrn |
| 5.3 | — | thin_film | resistivity | s-wave | 2025 | — | 2504.11065 |
| 5.1 | — | thin_film | resistivity | — | 2024 | T1 | 2404.16469 |
| 5.1 | — | thin_film | resistivity | — | 2022 | T1 | 2202.06310 |
| 5.0 | — | thin_film | resistivity | — | 2012 | T1 | 1209.4626 |
| 4.8 | — | thin_film | resistivity | — | 2021 | T1 | 2103.10751 |
| 4.7 | — | thin_film | resistivity | — | 2019 | T1 | DOI: 10.1103/PhysRevB.100.214505 |
| 4.7 | — | thin_film | resistivity | — | 2004 | T1 | DOI: 10.1103/PhysRevB.69.024505 |
| 4.7 | — | thin_film | resistivity | s-wave | 2004 | T1 | cond-mat/0403764 |
| 4.7 | — | thin_film | resistivity | — | 2004 | T1 | DOI: 10.1103/PhysRevLett.93.217005 |
| 4.6 | — | — | resistivity | — | 2000 | T1 | cond-mat/0003148 |
| 4.6 | ambient | thin_film | resistivity | — | 1999 | T1 | cond-mat/9903060 |
| 4.5 | — | thin_film | resistivity | — | 2022 | T1 | 2210.15065 |
| 4.5 | — | thin_film | resistivity | — | 2019 | T1 | 1903.05009 |
| 4.5 | — | thin_film | resistivity | — | 2019 | T1 | DOI: 10.1103/PhysRevApplied.12.054001 |
| 4.4 | — | thin_film | — | — | 2010 | T1 | 1007.5096 |
| 4.4 | — | thin_film | resistivity | s-wave | 2012 | T1 | 1211.6678 |
| 4.3 | — | thin_film | — | — | 2023 | — | 2312.09984 |
| 4.3 | — | thin_film | resistivity | — | 2004 | T1 | DOI: 10.1103/PhysRevLett.93.217005 |
| 4.1 | — | thin_film | — | — | 2010 | T1 | 1003.5584 |
| 4.0 | — | thin_film | resistivity | — | 2024 | T1 | DOI: 10.1103/PhysRevB.110.104519 |
| 4.0 | — | thin_film | resistivity | — | 2022 | T1 | 2202.06309 |
| 3.8 | — | thin_film | resistivity | s-wave | 2025 | T1 | 2509.14133 |
| 3.8 | — | thin_film | resistivity | — | 2019 | T1 | 1903.05009 |
| 3.8 | — | thin_film | resistivity | — | 2019 | T1 | DOI: 10.1103/PhysRevApplied.12.054001 |
| 3.7 | — | thin_film | resistivity | — | 2020 | T1 | 2005.00462 |
| 3.6 | — | thin_film | resistivity | — | 2019 | T1 | DOI: 10.1103/PhysRevB.100.214505 |
| 3.6 | — | thin_film | microwave | s-wave | 2012 | — | 1205.2463 |
| 3.6 | — | thin_film | resistivity | — | 2012 | T1 | 1212.4434 |
| 3.5 | — | thin_film | resistivity | — | 2026 | T1 | DOI: 10.1103/b5pl-fcby |
| 3.5 | — | thin_film | resistivity | — | 2013 | T1 | 1310.3176 |
| 3.4 | — | thin_film | resistivity | s-wave | 2012 | T1 | DOI: 10.1103/PhysRevB.86.184503 |
| 3.4 | — | thin_film | resistivity | s-wave | 2012 | T3 | 1210.6771 |
| 3.3 | — | thin_film | microwave | s-wave | 2012 | — | 1205.2463 |
| 3.2 | — | thin_film | resistivity | — | 2023 | T1 | 2307.02821 |
| 3.2 | — | thin_film | resistivity | — | 2014 | T1 | 1408.0270 |
| 3.2 | — | thin_film | microwave | s-wave | 2012 | — | 1205.2463 |
| 3.2 | — | thin_film | resistivity | — | 2012 | T1 | 1212.4434 |
| 3.2 | — | thin_film | resistivity | — | 2020 | T1 | 2011.09446 |
| 3.1 | — | thin_film | resistivity | — | 2023 | T1 | 2307.02821 |
| 3.1 | — | thin_film | resistivity | — | 2023 | T1 | 2307.02821 |
| 3.0 | — | thin_film | resistivity | — | 2020 | T1 | 2011.09446 |
| 3.0 | — | thin_film | resistivity | — | 2020 | T1 | 2011.09446 |
| 3.0 | — | thin_film | resistivity | — | 2020 | T1 | 2011.09446 |
| 2.9 | — | thin_film | — | — | 2022 | T1 | 2208.00317 |
| 2.7 | — | thin_film | resistivity | — | 2020 | T1 | 2011.09446 |
| 2.7 | — | thin_film | microwave | s-wave | 2012 | — | 1205.2463 |
| 2.7 | — | thin_film | resistivity | — | 2012 | T1 | 1212.4434 |
| 2.6 | — | thin_film | resistivity | — | 2020 | T1 | 2011.09446 |
| 2.6 | — | thin_film | resistivity | — | 2020 | T1 | 2011.09446 |
| 2.4 | — | thin_film | resistivity | — | 2020 | T1 | 2011.09446 |
| 2.4 | — | thin_film | resistivity | — | 2020 | T1 | 2011.09446 |
| 2.2 | — | thin_film | microwave | s-wave | 2012 | — | 1205.2463 |
| 2.2 | — | thin_film | resistivity | — | 2012 | T1 | 1212.4434 |
| 2.0 | — | thin_film | — | — | 2023 | — | 2312.09984 |
| 1.9 | — | thin_film | resistivity | — | 2020 | T1 | 2011.09446 |
| 1.9 | — | thin_film | resistivity | — | 2019 | T1 | 1903.05009 |
| 1.9 | — | thin_film | resistivity | — | 2019 | T1 | DOI: 10.1103/PhysRevApplied.12.054001 |
| 1.7 | — | thin_film | resistivity | — | 2018 | T1 | 1803.04275 |
| 1.6 | — | thin_film | — | — | 2017 | T1 | 1711.07914 |
| 1.5 | — | thin_film | resistivity | — | 2013 | T1 | 1310.3176 |
| 1.5 | — | thin_film | microwave | s-wave | 2012 | — | 1205.2463 |
| 1.5 | — | thin_film | resistivity | — | 2012 | T1 | 1212.4434 |
| 1.4 | — | thin_film | resistivity | — | 2019 | T1 | 1903.05009 |
| 1.4 | — | thin_film | resistivity | — | 2019 | T1 | DOI: 10.1103/PhysRevApplied.12.054001 |
| 1.4 | — | thin_film | — | — | 2014 | T3 | 1406.4010 |
| 1.3 | ambient | thin_film | resistivity | — | 2014 | T1 | 1402.0395 |
| 1.3 | — | thin_film | resistivity | — | 2008 | T1 | 0805.1356 |
| 1.1 | — | thin_film | resistivity | — | 2008 | T1 | DOI: 10.1103/PhysRevLett.101.157006 |
| 1.1 | — | thin_film | resistivity | — | 2020 | T1 | 2003.01763 |
| 1.1 | — | thin_film | resistivity | — | 2020 | T1 | DOI: 10.1103/PhysRevResearch.2.033307 |
| 1.1 | — | thin_film | resistivity | — | 2025 | T1 | 2507.13202 |
| 1.1 | — | thin_film | STM | — | 2020 | T1 | DOI: 10.1103/PhysRevResearch.2.033307 |
| 1.1 | — | thin_film | — | — | 2010 | T1 | 1003.5584 |
| 1.0 | — | thin_film | resistivity | — | 2010 | — | 1011.1592 |
| 1.0 | — | thin_film | resistivity | — | 2019 | T1 | DOI: 10.1103/PhysRevB.99.205115 |
| 1.0 | ambient | thin_film | resistivity | — | 2014 | T1 | 1402.0395 |
| 1.0 | — | thin_film | STM | — | 2014 | T1 | 1402.3178 |
| 1.0 | — | thin_film | susceptibility | — | 2012 | T1 | 1208.0871 |
| 1.0 | — | thin_film | resistivity | — | 2008 | T1 | 0805.1356 |
| 1.0 | — | thin_film | resistivity | — | 2013 | T1 | 1310.3176 |
| 0.8 | — | thin_film | — | — | 2010 | T1 | 1003.5584 |
| 0.8 | — | thin_film | resistivity | — | 2008 | T1 | DOI: 10.1103/PhysRevLett.101.157006 |
| 0.8 | — | thin_film | resistivity | — | 2020 | T1 | 2011.09446 |
| 0.8 | — | thin_film | resistivity | — | 2025 | T1 | 2507.13202 |
| 0.7 | — | thin_film | resistivity | — | 2013 | T1 | 1310.3176 |
| 0.7 | — | thin_film | resistivity | — | 2020 | T1 | 2003.01763 |
| 0.6 | ambient | thin_film | resistivity | — | 2003 | T1 | cond-mat/0309281 |
| 0.5 | — | thin_film | resistivity | — | 2022 | T1 | 2210.15065 |
| 0.5 | — | thin_film | resistivity | — | 2008 | T1 | DOI: 10.1103/PhysRevLett.101.157006 |
| 0.5 | — | thin_film | resistivity | — | 2008 | T1 | 0805.1356 |
| 0.4 | — | thin_film | resistivity | — | 2010 | — | 1011.1592 |
| 0.4 | — | thin_film | resistivity | — | 2013 | T1 | DOI: 10.1103/PhysRevB.88.180505 |
| — | — | thin_film | resistivity | — | 2025 | T1 | 2509.15067 |
| — | — | thin_film | resistivity | — | 2025 | T1 | DOI: 10.1103/5k9f-7gc7 |
| — | — | thin_film | resistivity | — | 2024 | T3 | 2405.18150 |
| — | — | thin_film | resistivity | — | 2024 | T1 | 2410.05950 |
| — | — | thin_film | resistivity | — | 2024 | T1 | 2406.16492 |
| — | — | — | — | — | 2024 | T1 | 2410.04569 |
| — | — | thin_film | resistivity, point_contact_spectroscopy | — | 2024 | T1 | 2404.16469 |
| — | — | thin_film | — | — | 2023 | T1 | DOI: 10.1103/PhysRevApplied.19.024013 |
| — | — | thin_film | resistivity | — | 2023 | T1 | DOI: 10.1103/PhysRevB.107.014511 |
| — | — | — | resistivity | — | 2022 | T3 | 2201.10425 |
| — | — | thin_film | STM | s-wave | 2022 | T1 | DOI: 10.1103/PhysRevB.105.214504 |
| — | — | thin_film | resistivity | — | 2021 | — | 2112.03457 |
| — | — | thin_film | resistivity | — | 2021 | T1 | 2103.08536 |
| — | — | — | — | — | 2021 | T1 | 2101.08535 |
| — | — | thin_film | resistivity | — | 2020 | T1 | 2009.01316 |
| — | — | thin_film | resistivity | — | 2019 | T1 | DOI: 10.1103/PhysRevApplied.12.014012 |
| — | — | thin_film | STM | — | 2019 | T1 | DOI: 10.1103/PhysRevB.100.214505 |
| — | ambient | thin_film | resistivity | — | 2014 | T1 | 1402.0395 |
| — | — | thin_film | — | — | 2014 | T3 | 1410.5793 |
| — | — | thin_film | resistivity | — | 2012 | — | 1209.0530 |
| — | — | thin_film | resistivity | — | 2012 | T1 | 1212.3984 |
| — | — | thin_film | resistivity | s-wave | 2012 | T1 | DOI: 10.1103/PhysRevLett.109.107003 |
| — | — | thin_film | resistivity | — | 2011 | T1 | 1109.5270 |
| — | ambient | thin_film | resistivity | — | 2010 | T1 | 1004.5153 |
| — | — | thin_film | resistivity | — | 2010 | T3 | 1010.6063 |
| — | — | thin_film | resistivity | — | 2007 | T1 | DOI: 10.1103/PhysRevLett.98.127003 |
| — | — | thin_film | resistivity | — | 2007 | T1 | DOI: 10.1103/PhysRevLett.99.257003 |
| — | — | thin_film | resistivity | — | 2007 | T3 | 0705.1602 |
| — | — | thin_film | resistivity | — | 2006 | T2 | cond-mat/0602557 |
| — | — | thin_film | resistivity | — | 2003 | T1 | DOI: 10.1103/PhysRevLett.90.067002 |
Structure
- Crystal structure
- cfc cubic
- Space group
- I4/mmm
- Lattice a (Å)
- 4.200
Superconducting parameters
- Pairing symmetry
- s-wave
- Gap structure
- full_gap
- Hc2
- 8.5 T (estimated from the transport measurements)
- λ_eph (e–ph coupling)
- —
Competing orders
- ρ(T) exponent
- 1.00
Samples & pressure
- Sample form
- thin_film
- Substrate
- Si
- Pressure type
- none
- Doping type
- none