Tc max
1.6 K
Tc ambient
1.6 K
arXiv year
2014
Papers
2
Tc max measured at thin_film, arXiv:1711.07914, confirmed by 2 papers
Evidence (2 records from 2 papers)
the flat columns above are aggregates — each line here is one paper's claim| Tc (K) | P (GPa) | Sample | Method | Pairing | Year | Tier | Paper |
|---|---|---|---|---|---|---|---|
| 1.6 | — | thin_film | — | — | 2017 | — | 1711.07914 |
| 1.4 | — | thin_film | — | — | 2014 | — | 1406.4010 |
Superconducting parameters
- λ_eph (e–ph coupling)
- —
Samples & pressure
- Sample form
- thin_film
- Substrate
- silicon-on-insulator (SOI) wafer