Tc max
7.4 K
Tc ambient
6.0 K
arXiv year
2016
Papers
4
Tc exp.
7.4 K
Tc theo.
—
Evidence
experimental
Tc max measured at thin_film, resistivity, arXiv:1612.06506
Evidence (5 records from 4 papers)
the flat columns above are aggregates — each line here is one paper's claim| Tc (K) | P (GPa) | Sample | Method | Pairing | Year | Tier | Paper |
|---|---|---|---|---|---|---|---|
| 7.4 | — | thin_film | resistivity | — | 2016 | T1 | 1612.06506 |
| 6.0 | ambient | thin_film | resistivity | — | 2017 | T1 | DOI: 10.1103/PhysRevB.96.104505 |
| 5.0 |
Structure
- Crystal structure
- cubic
- Space group
- B2/m
- Lattice a (Å)
- 9.220
- Lattice c (Å)
- 5.990
Superconducting parameters
- Hc2
- 13.7 T (0 K)
- λ_eph (e–ph coupling)
- —
Samples & pressure
- Sample form
- thin_film
- Substrate
- α-Al2O3