Tc max
3.0 K
Tc ambient
—
arXiv year
2009
Papers
11
Tc exp.
3.0 K
Tc theo.
6.0 K
Evidence
mixed
Tc max measured at thin_film, resistivity, arXiv:1607.04438, confirmed by 3 papers
Evidence (13 records from 11 papers)
the flat columns above are aggregates — each line here is one paper's claim| Tc (K) | P (GPa) | Sample | Method | Pairing | Year | Tier | Paper |
|---|---|---|---|---|---|---|---|
| 6.0 | — | — | — | — | 2016 | T1 | DOI: 10.1103/PhysRevB.94.214507 |
| 3.0 | — | thin_film | resistivity | — | 2016 | T1 | 1607.04438 |
| 2.9 | — | — | resistivity | s_pm | 2023 | T3 | 2308.02475 |
| 1.8 | 3.0 | single_crystal | resistivity | — | 2009 | T1 | DOI: 10.1103/PhysRevLett.103.236401 |
| 0.8 | 5.0 | — | — | — | 2011 | T1 | 1104.0492 |
| 0.6 | 7.0 | — | — | — | 2011 | T1 | 1104.0492 |
| 0.4 | 10.0 | — | — | — | 2011 | T1 | 1104.0492 |
| — | — | — | resistivity, STM | — | 2025 | — | 2506.23871 |
| — | — | — | — | s-wave | 2024 | T2 | 2407.19588 |
| — | — | — | — | — | 2018 | — | 1806.03773 |
| — | — | thin_film | — | — | 2018 | T1 | 1803.10936 |
| — | — | single_crystal | — | — | 2015 | T1 | DOI: 10.1103/PhysRevB.91.094510 |
| — | — | — | — | s_pm | 2014 | T1 | 1403.4271 |
Structure
- Crystal structure
- P3̅m1
- Space group
- P3̅m1
Superconducting parameters
- λ_eph (e–ph coupling)
- 1.57
- ω_log
- 175 K
Competing orders
- Competing order
- CDW
- T_CDW
- 170.0 K
Samples & pressure
- Substrate
- hexagonal boron nitride
- Pressure type
- hydrostatic