Tc max
3.0 K
Tc ambient
—
arXiv year
2009
Papers
11
Tc exp.
3.0 K
Tc theo.
6.0 K
Evidence
mixed
Tc max measured at thin_film, resistivity, arXiv:1607.04438
Evidence (13 records from 11 papers)
the flat columns above are aggregates — each line here is one paper's claim| Tc (K) | P (GPa) | Sample | Method | Pairing | Year | Tier | Paper |
|---|---|---|---|---|---|---|---|
| 6.0 | — | — | — | — | 2016 | T1 | DOI: 10.1103/PhysRevB.94.214507 |
| 3.0 | — | thin_film | resistivity | — | 2016 | T1 | 1607.04438 |
| 2.9 | — |
Structure
- Crystal structure
- P3̅m1
- Space group
- P3̅m1
Superconducting parameters
- λ_eph (e–ph coupling)
- 1.57
- ω_log
- 175 K
Competing orders
- Competing order
- CDW
- T_CDW
- 170.0 K
Samples & pressure
- Substrate
- hexagonal boron nitride
- Pressure type
- hydrostatic