Tc max
112.0 K
Tc ambient
110.0 K
arXiv year
1988
Papers
66
Tc exp.
114.0 K
Tc theo.
112.0 K
Evidence
experimental
Tc max measured at thin_film, susceptibility, DOI: 10.1103/PhysRevLett.80.4293, confirmed by 2 papers
Evidence (74 records from 66 papers)
the flat columns above are aggregates — each line here is one paper's claim| Tc (K) | P (GPa) | Sample | Method | Pairing | Year | Tier | Paper |
|---|---|---|---|---|---|---|---|
| 120.0 | — | thin_film | resistivity | — | 2004 | T1 | cond-mat/0412069 |
| 114.0 | — | thin_film | susceptibility | — | 1998 | T1 | DOI: 10.1103/PhysRevLett.80.4293 |
| 112.0 |
Structure
- Crystal structure
- tetragonal
- Space group
- I4/mmm
- Lattice a (Å)
- 3.850
- Lattice c (Å)
- 29.300
Superconducting parameters
- Pairing symmetry
- d-wave
- λ_eph (e–ph coupling)
- —
Samples & pressure
- Substrate
- LaAlO3
- Pressure type
- none
- Doping type
- hole