Tc max
110.0 K
Tc ambient
110.0 K
arXiv year
1989
Papers
8
Tc exp.
109.0 K
Tc theo.
—
Evidence
experimental
Tc max measured at thin_film, resistivity, DOI: 10.1103/PhysRevB.39.2779, confirmed by 2 papers
Evidence (10 records from 8 papers)
the flat columns above are aggregates — each line here is one paper's claim| Tc (K) | P (GPa) | Sample | Method | Pairing | Year | Tier | Paper |
|---|---|---|---|---|---|---|---|
| 110.0 | — | thin_film | resistivity | — | 1989 | T1 | DOI: 10.1103/PhysRevB.39.2779 |
| 109.0 | — | single_crystal | susceptibility | — | 2005 | T1 | cond-mat/0503250 |
| 102.5 |
Structure
- Lattice c (Å)
- 29.280
Superconducting parameters
- Pairing symmetry
- d-wave
- λ_eph (e–ph coupling)
- —
Samples & pressure
- Sample form
- thin_film
- Substrate
- MgO