Tc max
2.3 K
Tc ambient
—
arXiv year
2015
Papers
1
Tc exp.
2.3 K
Tc theo.
—
Evidence
experimental
Tc max measured at thin_film, resistivity, DOI: 10.1103/PhysRevLett.115.147003
Evidence (1 record from 1 paper)
the flat columns above are aggregates — each line here is one paper's claim| Tc (K) | P (GPa) | Sample | Method | Pairing | Year | Tier | Paper |
|---|---|---|---|---|---|---|---|
| 2.3 | — | thin_film | resistivity | — | 2015 | T1 | DOI: 10.1103/PhysRevLett.115.147003 |
Superconducting parameters
- Hc2
- 0.7 T (0 K, H perpendicular to surface)
- λ_eph (e–ph coupling)
- 1.60
Samples & pressure
- Sample form
- thin_film
- Substrate
- Si(111)