Tc max
78.0 K
Tc ambient
50.0 K
arXiv year
1989
Papers
13
Tc exp.
78.0 K
Tc theo.
—
Evidence
experimental
Tc max measured at thin_film, STM, DOI: 10.1103/PhysRevLett.87.087003, confirmed by 2 papers
Evidence (18 records from 13 papers)
the flat columns above are aggregates — each line here is one paper's claim| Tc (K) | P (GPa) | Sample | Method | Pairing | Year | Tier | Paper |
|---|---|---|---|---|---|---|---|
| 80.0 | — | polycrystal | muSR | — | 1989 | T1 | DOI: 10.1103/PhysRevLett.62.2317 |
| 78.0 | — | thin_film | STM | unknown | 2001 | T1 | DOI: 10.1103/PhysRevLett.87.087003 |
| 59.0 | — | thin_film | susceptibility | d-wave | 2015 | T1 | DOI: 10.1103/PhysRevB.91.104524 |
| 55.0 | — | polycrystal | resistivity | — | 1998 | T1 | DOI: 10.1103/PhysRevB.58.12495 |
| 50.0 | ambient | thin_film | resistivity | — | 1995 | T1 | DOI: 10.1103/PhysRevB.52.4559 |
| 42.0 | — | thin_film | susceptibility | d-wave | 2015 | T1 | DOI: 10.1103/PhysRevB.91.104524 |
| 30.0 | — | polycrystal | resistivity | — | 2012 | T2 | 1202.5825 |
| 25.0 | — | thin_film | susceptibility | d-wave | 2015 | T1 | DOI: 10.1103/PhysRevB.91.104524 |
| 14.0 | — | thin_film | susceptibility | d-wave | 2015 | T1 | DOI: 10.1103/PhysRevB.91.104524 |
| 8.3 | — | thin_film | susceptibility | d-wave | 2015 | T1 | DOI: 10.1103/PhysRevB.91.104524 |
| 6.6 | — | thin_film | susceptibility | d-wave | 2015 | T1 | DOI: 10.1103/PhysRevB.91.104524 |
| — | — | thin_film | resistivity | — | 2023 | T3 | 2309.17408 |
| — | — | thin_film | resistivity | — | 2013 | T1 | 1308.0865 |
| — | — | — | susceptibility | — | 2011 | T1 | 1106.3144 |
| — | — | thin_film | — | d-wave | 2004 | T2 | cond-mat/0402655 |
| — | — | thin_film | susceptibility | d-wave | 2004 | T1 | DOI: 10.1103/PhysRevLett.93.187004 |
| — | — | thin_film | resistivity | — | 2002 | T1 | cond-mat/0211048 |
| — | — | thin_film | STM | unknown | 2001 | T2 | cond-mat/0103205 |
Structure
- Phase
- cuprate_123
- Lattice a (Å)
- 3.829
- Lattice c (Å)
- 11.692
Superconducting parameters
- Pairing symmetry
- d-wave
- Gap structure
- nodal
- λ_eph (e–ph coupling)
- —
Competing orders
- ρ(T) exponent
- 1.00
Samples & pressure
- Sample form
- thin_film
- Substrate
- SrTiO3
- Doping type
- hole
- Doping level
- 0.300