Tc max
78.0 K
Tc ambient
50.0 K
arXiv year
1989
Papers
13
Tc exp.
78.0 K
Tc theo.
—
Evidence
experimental
Tc max measured at thin_film, STM, DOI: 10.1103/PhysRevLett.87.087003, confirmed by 2 papers
Evidence (18 records from 13 papers)
the flat columns above are aggregates — each line here is one paper's claim| Tc (K) | P (GPa) | Sample | Method | Pairing | Year | Tier | Paper |
|---|---|---|---|---|---|---|---|
| 80.0 | — | polycrystal | muSR | — | 1989 | T1 | DOI: 10.1103/PhysRevLett.62.2317 |
| 78.0 | — | thin_film | STM | unknown | 2001 | T1 | DOI: 10.1103/PhysRevLett.87.087003 |
| 59.0 |
Structure
- Phase
- cuprate_123
- Lattice a (Å)
- 3.829
- Lattice c (Å)
- 11.692
Superconducting parameters
- Pairing symmetry
- d-wave
- Gap structure
- nodal
- λ_eph (e–ph coupling)
- —
Competing orders
- ρ(T) exponent
- 1.00
Samples & pressure
- Sample form
- thin_film
- Substrate
- LaAlO3
- Doping type
- hole
- Doping level
- 0.300