Tc max
91.0 K
Tc ambient
91.0 K
arXiv year
1994
Papers
9
Tc exp.
85.5 K
Tc theo.
—
Evidence
experimental
Tc max measured at thin_film, resistivity, arXiv:cond-mat/0301288, confirmed by 3 papers
Evidence (14 records from 9 papers)
the flat columns above are aggregates — each line here is one paper's claim| Tc (K) | P (GPa) | Sample | Method | Pairing | Year | Tier | Paper |
|---|---|---|---|---|---|---|---|
| 91.0 | — | thin_film | resistivity | d-wave | 2003 | T2 | cond-mat/0301288 |
| 86.0 | — | thin_film | resistivity | d-wave | 2003 | T2 | cond-mat/0301288 |
| 85.5 | — | single_crystal | susceptibility, neutron | d-wave | 2003 | T1 | DOI: 10.1103/PhysRevLett.91.237002 |
| 85.5 | — | single_crystal | susceptibility, neutron | — | 2003 | T1 | cond-mat/0308394 |
| 85.0 | — | thin_film | resistivity | d-wave | 2003 | T2 | cond-mat/0301288 |
| 82.0 | — | thin_film | resistivity | d-wave | 2003 | T2 | cond-mat/0301288 |
| 79.0 | — | thin_film | resistivity | d-wave | 2003 | T2 | cond-mat/0301288 |
| 78.0 | — | thin_film | resistivity | d-wave | 2012 | T1 | 1205.5414 |
| 78.0 | — | polycrystal | resistivity | — | 1998 | T1 | DOI: 10.1103/PhysRevB.58.12495 |
| 75.0 | — | polycrystal | susceptibility | — | 1994 | T1 | DOI: 10.1103/PhysRevB.50.594 |
| 71.0 | — | thin_film | resistivity | d-wave | 2003 | T2 | cond-mat/0301288 |
| 31.0 | — | single_crystal | susceptibility | — | 2024 | T1 | 2402.03238 |
| — | — | — | susceptibility | — | 2011 | T1 | 1106.3144 |
| — | — | thin_film | — | d-wave | 2004 | T1 | cond-mat/0404081 |
Structure
- Phase
- cuprate_123
- Lattice a (Å)
- 3.832
- Lattice c (Å)
- 11.746
Superconducting parameters
- Pairing symmetry
- d-wave
- Gap structure
- nodal
- λ_eph (e–ph coupling)
- —
Samples & pressure
- Doping type
- hole
- Doping level
- 0.100