Y₁-xCaxBa₂Cu₃O₇-δ

cuprate · cuprate_123

ambient SCunconventionaldisputed

Tc max

83.0 K

Tc ambient

83.0 K

arXiv year

1994

Papers

Tc exp.

83.0 K

Tc theo.

—

Evidence

experimental

Tc max measured at ambient, thin_film, resistivity, DOI: 10.1103/PhysRevLett.90.207005, confirmed by 2 papers

Evidence (20 records from 17 papers)

the flat columns above are aggregates — each line here is one paper's claim

Tc (K)	P (GPa)	Sample	Method	Pairing	Year	Tier	Paper
89.0	—	thin_film	—	d-wave	2007	T1	DOI: 10.1103/PhysRevLett.98.177003
85.0	—	thin_film	—	d-wave	2007	T1	DOI: 10.1103/PhysRevLett.98.177003
83.0	ambient	thin_film	resistivity	d-wave	2003	T1	DOI: 10.1103/PhysRevLett.90.207005
81.0	—	thin_film	—	d-wave	2007	T1	DOI: 10.1103/PhysRevLett.98.177003
78.0	—	thin_film	—	d-wave	2007	T1	DOI: 10.1103/PhysRevLett.98.177003
62.0	—	thin_film	resistivity	—	2010	T1	1004.5554
51.0	—	polycrystal	susceptibility	—	1995	T1	DOI: 10.1103/PhysRevB.51.12911
47.0	—	polycrystal	resistivity	—	1996	T1	DOI: 10.1103/PhysRevB.53.R11972
3.0	—	thin_film	—	—	2007	T1	0707.2397
—	—	—	susceptibility	—	2014	T1	1407.6337
—	—	single_crystal	resistivity	—	2010	T3	1009.1559
—	—	thin_film	—	—	2005	T1	cond-mat/0503210
—	—	—	resistivity	—	2004	T3	cond-mat/0412154
—	—	polycrystal	resistivity	—	2004	T3	cond-mat/0409004
—	—	thin_film	resistivity	—	2004	T3	cond-mat/0409232
—	ambient	thin_film	resistivity	—	2004	T1	DOI: 10.1103/PhysRevB.70.174511
—	—	polycrystal	resistivity	—	2003	T1	cond-mat/0301375
—	—	polycrystal	susceptibility	—	1998	T1	DOI: 10.1103/PhysRevB.58.15053
—	—	polycrystal	susceptibility	d-wave	1998	T1	DOI: 10.1103/PhysRevB.57.10984
—	—	polycrystal	resistivity	—	1994	T1	DOI: 10.1103/PhysRevB.49.6353