Tc max
82.0 K
Tc ambient
—
arXiv year
1998
Papers
5
Tc exp.
82.0 K
Tc theo.
—
Evidence
experimental
Tc max measured at polycrystal, susceptibility, DOI: 10.1103/PhysRevB.69.104512, confirmed by 2 papers
Evidence (15 records from 5 papers)
the flat columns above are aggregates — each line here is one paper's claim| Tc (K) | P (GPa) | Sample | Method | Pairing | Year | Tier | Paper |
|---|---|---|---|---|---|---|---|
| 82.0 | — | polycrystal | susceptibility | — | 2004 | T1 | DOI: 10.1103/PhysRevB.69.104512 |
| 80.1 | — | thin_film | resistivity | d-wave | 1998 | T1 | DOI: 10.1103/PhysRevLett.80.3594 |
| 73.0 | — | polycrystal | susceptibility | — | 2004 | T1 | DOI: 10.1103/PhysRevB.69.104512 |
| 70.0 | — | polycrystal | susceptibility | — | 2004 | T1 | DOI: 10.1103/PhysRevB.69.104512 |
| 65.0 | — | thin_film | resistivity | d-wave | 1998 | T1 | DOI: 10.1103/PhysRevLett.80.3594 |
| 62.5 | — | polycrystal | susceptibility | — | 2004 | T1 | DOI: 10.1103/PhysRevB.69.104512 |
| 62.1 | — | thin_film | resistivity | d-wave | 1998 | T1 | DOI: 10.1103/PhysRevLett.80.3594 |
| 49.5 | — | polycrystal | susceptibility | — | 2004 | T1 | DOI: 10.1103/PhysRevB.69.104512 |
| 35.0 | — | polycrystal | susceptibility | — | 2004 | T1 | DOI: 10.1103/PhysRevB.69.104512 |
| 34.0 | — | polycrystal | susceptibility | — | 2004 | T1 | DOI: 10.1103/PhysRevB.69.104512 |
| 20.0 | — | polycrystal | susceptibility | — | 2004 | T1 | DOI: 10.1103/PhysRevB.69.104512 |
| 14.0 | — | polycrystal | susceptibility | — | 2004 | T1 | DOI: 10.1103/PhysRevB.69.104512 |
| — | — | single_crystal | resistivity, Raman scattering | — | 2009 | T1 | 0901.0620 |
| — | — | single_crystal | resistivity | — | 2009 | T1 | DOI: 10.1103/PhysRevB.79.014511 |
| — | — | polycrystal | resistivity | — | 2002 | T1 | DOI: 10.1103/PhysRevB.65.180515 |
Structure
- Phase
- cuprate_123
Superconducting parameters
- Pairing symmetry
- d-wave
- λ_eph (e–ph coupling)
- —
Samples & pressure
- Sample form
- polycrystal
- Substrate
- SrTiO3
- Doping type
- hole
- Doping level
- 0.150