Tc max
91.9 K
Tc ambient
—
arXiv year
1992
Papers
3
Tc exp.
91.9 K
Tc theo.
—
Evidence
experimental
Tc max measured at polycrystal, resistivity, DOI: 10.1103/PhysRevLett.69.3812
Evidence (10 records from 3 papers)
the flat columns above are aggregates — each line here is one paper's claim| Tc (K) | P (GPa) | Sample | Method | Pairing | Year | Tier | Paper |
|---|---|---|---|---|---|---|---|
| 91.9 | — | polycrystal | resistivity | — | 1992 | T1 | DOI: 10.1103/PhysRevLett.69.3812 |
| 88.5 | — | polycrystal | resistivity | — | 1992 | T1 | DOI: 10.1103/PhysRevLett.69.3812 |
| 73.3 | — | polycrystal | resistivity | — | 1992 | T1 | DOI: 10.1103/PhysRevLett.69.3812 |
| 62.5 | — | polycrystal | resistivity | — | 1992 | T1 | DOI: 10.1103/PhysRevLett.69.3812 |
| 45.3 | — | polycrystal | resistivity | — | 1992 | T1 | DOI: 10.1103/PhysRevLett.69.3812 |
| 31.1 | — | polycrystal | resistivity | — | 1992 | T1 | DOI: 10.1103/PhysRevLett.69.3812 |
| 22.1 | — | polycrystal | resistivity | — | 1992 | T1 | DOI: 10.1103/PhysRevLett.69.3812 |
| 12.7 | — | polycrystal | resistivity | — | 1992 | T1 | DOI: 10.1103/PhysRevLett.69.3812 |
| — | — | thin_film | resistivity | — | 2007 | T1 | DOI: 10.1103/PhysRevB.76.014518 |
| — | — | — | resistivity | — | 2005 | T2 | cond-mat/0510808 |
Superconducting parameters
- Pairing symmetry
- d-wave
- λ_eph (e–ph coupling)
- —
Samples & pressure
- Substrate
- LaAlO3
- Doping level
- 0.350