Tc max
80.0 K
Tc ambient
80.0 K
arXiv year
1998
Papers
3
Tc exp.
80.0 K
Tc theo.
—
Evidence
experimental
Tc max measured at ambient, thin_film, resistivity, arXiv:1710.10672
Evidence (3 records from 3 papers)
the flat columns above are aggregates — each line here is one paper's claim| Tc (K) | P (GPa) | Sample | Method | Pairing | Year | Tier | Paper |
|---|---|---|---|---|---|---|---|
| 80.0 | ambient | thin_film | resistivity | — | 2017 | T1 | 1710.10672 |
| 79.0 | — | single_crystal | susceptibility | — | 1998 | T1 | DOI: 10.1103/PhysRevB.58.R5940 |
| 78.9 |
Structure
- Phase
- cuprate_123
Superconducting parameters
- Pairing symmetry
- d-wave
- λ_eph (e–ph coupling)
- —
Samples & pressure
- Sample form
- single_crystal
- Doping type
- hole