Tc max
82.0 K
Tc ambient
82.0 K
arXiv year
1988
Papers
1
Tc exp.
82.0 K
Tc theo.
—
Evidence
experimental
Tc max measured at thin_film, resistivity, DOI: 10.1103/PhysRevB.38.5031
Evidence (2 records from 1 paper)
the flat columns above are aggregates — each line here is one paper's claim| Tc (K) | P (GPa) | Sample | Method | Pairing | Year | Tier | Paper |
|---|---|---|---|---|---|---|---|
| 82.0 | — | thin_film | resistivity | — | 1988 | T1 | DOI: 10.1103/PhysRevB.38.5031 |
| 79.0 | — | thin_film | resistivity | — | 1988 | T1 | DOI: 10.1103/PhysRevB.38.5031 |
Structure
- Crystal structure
- Ammm
- Lattice a (Å)
- 3.860
- Lattice c (Å)
- 27.240
Superconducting parameters
- Pairing symmetry
- d-wave
- λ_eph (e–ph coupling)
- —
Samples & pressure
- Substrate
- SrTiO3