Tc max
130.0 K
Tc ambient
130.0 K
arXiv year
1987
Papers
25
Tc exp.
93.0 K
Tc theo.
—
Evidence
experimental
Tc max measured at polycrystal, resistivity, DOI: 10.1103/PhysRevLett.59.1468, confirmed by 2 papers
Evidence (28 records from 25 papers)
the flat columns above are aggregates — each line here is one paper's claim| Tc (K) | P (GPa) | Sample | Method | Pairing | Year | Tier | Paper |
|---|---|---|---|---|---|---|---|
| 130.0 | — | polycrystal | resistivity | — | 1987 | T1 | DOI: 10.1103/PhysRevLett.59.1468 |
| 93.0 | — | single_crystal | susceptibility | — | 2000 | T2 | cond-mat/0004122 |
| 92.0 | — | polycrystal | resistivity | — | 1988 | T1 | DOI: 10.1103/PhysRevLett.61.1423 |
| 91.6 | — | — | resistivity | — | 1998 | T2 | cond-mat/9805105 |
| 91.0 | — | thin_film | resistivity | — | 1996 | T1 | DOI: 10.1103/PhysRevB.53.90 |
| 91.0 | — | polycrystal | susceptibility | — | 1990 | T1 | DOI: 10.1103/PhysRevLett.64.1561 |
| 90.0 | — | thin_film | resistivity | — | 2017 | T3 | 1710.05409 |
| 87.0 | — | thin_film | susceptibility | — | 2001 | T1 | DOI: 10.1103/PhysRevB.63.094512 |
| 87.0 | — | thin_film | resistivity | d-wave | 1999 | T2 | cond-mat/9903065 |
| 86.5 | — | thin_film | resistivity | — | 2012 | T1 | 1201.1886 |
| 85.0 | — | thin_film | resistivity | — | 2012 | T1 | 1201.1886 |
| 85.0 | — | thin_film | resistivity | — | 1995 | T1 | DOI: 10.1103/PhysRevLett.75.3934 |
| 82.0 | — | thin_film | resistivity | d-wave | 2000 | T1 | cond-mat/0010128 |
| 80.0 | — | thin_film | resistivity | — | 1989 | T1 | DOI: 10.1103/PhysRevB.40.9299 |
| 78.0 | — | thin_film | resistivity | — | 2012 | T1 | 1201.1886 |
| 75.0 | — | thin_film | resistivity | — | 2012 | T1 | 1201.1886 |
| — | — | thin_film | — | — | 2017 | T1 | 1711.10230 |
| — | — | thin_film | resistivity | d-wave | 2012 | T1 | DOI: 10.1103/PhysRevLett.109.050601 |
| — | — | thin_film | resistivity | — | 2011 | T1 | 1103.1847 |
| — | — | thin_film | resistivity | — | 2010 | — | 1002.2548 |
| — | — | thin_film | susceptibility | — | 2007 | T1 | 0711.3094 |
| — | — | thin_film | — | — | 2005 | T3 | cond-mat/0511060 |
| — | — | single_crystal | resistivity | — | 2002 | T3 | cond-mat/0211233 |
| — | — | polycrystal | susceptibility | — | 2001 | T1 | cond-mat/0106379 |
| — | — | thin_film | — | — | 2000 | T3 | cond-mat/0003396 |
| — | — | polycrystal | resistivity | — | 1991 | T1 | DOI: 10.1103/PhysRevB.43.2940 |
| — | — | polycrystal | — | — | 1991 | T1 | DOI: 10.1103/PhysRevB.43.2946 |
| — | — | polycrystal | — | — | 1988 | T1 | DOI: 10.1103/PhysRevLett.60.1455 |
Structure
- Phase
- cuprate_123
Superconducting parameters
- Pairing symmetry
- d-wave
- λ_eph (e–ph coupling)
- —
Samples & pressure
- Sample form
- thin_film
- Substrate
- NdGaO3
- Doping type
- none