Zn

elemental

ambient SC

Tc max

0.8 K

Tc ambient

0.8 K

arXiv year

1992

Papers

Tc exp.

1.0 K

Tc theo.

—

Evidence

experimental

Tc max measured at wire, resistivity, DOI: 10.1103/PhysRevLett.98.247001, confirmed by 2 papers

Evidence (25 records from 16 papers)

the flat columns above are aggregates — each line here is one paper's claim

Tc (K)	P (GPa)	Sample	Method	Pairing	Year	Tier	Paper
1.1	—	wire	resistivity	—	2007	T1	DOI: 10.1103/PhysRevLett.98.247001
1.0	—	wire	resistivity	—	2005	T1	DOI: 10.1103/PhysRevLett.95.076802
0.9	—	wire	specific_heat	—	2007	T1	DOI: 10.1103/PhysRevLett.98.247001
0.9	—	wire	resistivity	—	2006	T1	DOI: 10.1103/PhysRevB.74.014515
0.9	—	wire	specific_heat, resistivity	—	2007	T1	DOI: 10.1103/PhysRevLett.98.247001
0.9	—	—	—	—	2003	T2	cond-mat/0302086
0.8	—	wire	resistivity	—	2011	T1	DOI: 10.1103/PhysRevB.83.054505
0.8	—	thin_film	resistivity	—	2010	T1	1002.2016
0.8	—	wire	resistivity	—	2009	T1	DOI: 10.1103/PhysRevLett.103.127002
0.8	—	wire	resistivity	—	2011	T1	DOI: 10.1103/PhysRevB.83.054505
0.8	—	thin_film	resistivity	—	2010	T1	1002.2016
0.8	—	wire	resistivity	s-wave	1996	T1	DOI: 10.1103/PhysRevB.54.16077
0.8	—	wire	resistivity	—	2011	T1	DOI: 10.1103/PhysRevB.83.054505
0.8	—	wire	resistivity	—	2011	T1	DOI: 10.1103/PhysRevB.83.054505
0.8	—	thin_film	resistivity	—	2010	T1	1002.2016
0.8	—	wire	resistivity	—	2011	T1	DOI: 10.1103/PhysRevB.83.054505
0.8	—	thin_film	resistivity	—	2010	T1	1002.2016
0.7	—	wire	resistivity	—	2014	T1	1403.6880
—	ambient	—	—	—	2026	T2	2601.13292
—	ambient	polycrystal	susceptibility	—	2016	T1	1612.01376
—	—	single_crystal	—	—	2013	T1	1311.4727
—	—	wire	resistivity	—	2009	—	0901.3519
—	—	thin_film	resistivity	—	2005	T1	cond-mat/0502100
—	—	—	resistivity	—	2004	T1	cond-mat/0410054
—	—	thin_film	resistivity	—	1992	T1	DOI: 10.1103/PhysRevB.45.895