Tc max
1.6 K
Tc ambient
—
arXiv year
1993
Papers
2
Tc exp.
1.6 K
Tc theo.
—
Evidence
experimental
Tc max measured at polycrystal, resistivity, DOI: 10.1103/PhysRevB.51.625
Evidence (3 records from 2 papers)
the flat columns above are aggregates — each line here is one paper's claim| Tc (K) | P (GPa) | Sample | Method | Pairing | Year | Tier | Paper |
|---|---|---|---|---|---|---|---|
| 1.6 | — | polycrystal | resistivity | — | 1995 | T1 | DOI: 10.1103/PhysRevB.51.625 |
| 0.9 | — | thin_film | resistivity | — | 1995 | T1 | DOI: 10.1103/PhysRevB.51.625 |
| — |
Superconducting parameters
- λ_eph (e–ph coupling)
- —
Samples & pressure
- Sample form
- polycrystal
- Substrate
- sapphire