Tc max
4.4 K
Tc ambient
—
arXiv year
1987
Papers
2
Tc exp.
4.4 K
Tc theo.
—
Evidence
experimental
Tc max measured at polycrystal, resistivity, DOI: 10.1103/PhysRevB.35.5361
Evidence (4 records from 2 papers)
the flat columns above are aggregates — each line here is one paper's claim| Tc (K) | P (GPa) | Sample | Method | Pairing | Year | Tier | Paper |
|---|---|---|---|---|---|---|---|
| 4.4 | — | polycrystal | resistivity, specific_heat | — | 1987 | T1 | DOI: 10.1103/PhysRevB.35.5361 |
| 2.9 | — | thin_film | resistivity | — | 1997 | T1 | DOI: 10.1103/PhysRevB.56.6148 |
| 2.8 |
Superconducting parameters
- λ_eph (e–ph coupling)
- —
Samples & pressure
- Substrate
- Si3N4