Tc max
5.5 K
Tc ambient
5.5 K
arXiv year
2005
Papers
9
Tc exp.
5.2 K
Tc theo.
—
Evidence
experimental
Tc max measured at thin_film, resistivity, DOI: 10.1103/qc3p-g2y3, confirmed by 3 papers
Evidence (16 records from 9 papers)
the flat columns above are aggregates — each line here is one paper's claim| Tc (K) | P (GPa) | Sample | Method | Pairing | Year | Tier | Paper |
|---|---|---|---|---|---|---|---|
| 5.5 | — | thin_film | resistivity | — | 2025 | T1 | DOI: 10.1103/qc3p-g2y3 |
| 5.2 | ambient | polycrystal | — | — | 2012 | T1 | 1206.1700 |
| 5.2 | — |
Structure
- Crystal structure
- TiS3-type
- Space group
- P21/m (#11)
- Lattice c (Å)
- 10.000
Superconducting parameters
- λ_eph (e–ph coupling)
- —
Competing orders
- Competing order
- CDW
- T_CDW
- 63.0 K
Samples & pressure
- Sample form
- single_crystal
- Substrate
- Al2O3