Determining Interface Dielectric Losses in Superconducting Coplanar-Waveguide Resonators
W. Woods, G. Calusine, A. Melville, A. Sevi, E. Golden, D.K. Kim, D. Rosenberg, J.L. Yoder, W.D. Oliver
DOI 10.1103/PhysRevApplied.12.014012 · Physical Review Applied
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Abstract
Superconducting quantum-computing architectures comprise resonators and qubits that experience energy loss due to two-level systems (TLSs) in bulk and interfacial dielectrics. An understanding of these losses is critical to improving performance in superconducting circuits. In this work, we present a method for quantifying the TLS losses of different bulk and interfacial dielectrics present in superconducting coplanar-waveguide (CPW) resonators. By combining statistical characterization of sets of specifically designed CPW resonators on isotropically etched silicon substrates with detailed electromagnetic modeling, we determine the separate loss contributions from individual material interfaces and bulk dielectrics. This technique for analyzing interfacial TLS losses can be used to guide targeted improvements to qubits, resonators, and their superconducting fabrication processes.
Source-reported materials — not catalogue approval
| Formula | Reported Tc (K) | Pressure (GPa) | Type |
|---|---|---|---|
| TiN Archive — visibility unverified Source-occurrence policy only; no material identity or catalogue acceptance is inferred from the formula. | — | Pressure not reported | unknown |
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