Electrostatic Control of Phase Slips in Ti Josephson Nanotransistors
C. Puglia, G. De Simoni, F. Giazotto
DOI 10.1103/PhysRevApplied.13.054026 · Physical Review Applied
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Abstract
The investigation of the switching-current probability distribution of a Josephson junction is a conventional tool to gain information on the dynamics of the phase slips as a function of the temperature. Here we adopt this well-established technique to probe the impact of an external static electric field on the occurrence of phase slips in gated all-metallic titanium (Ti) Josephson weak links. We show, in a temperature range between 20 and 420 mK, that the evolution of the dynamics of the phase slips as a function of the electrostatic field starkly differs from that observed as a function of the temperature. This fact demonstrates, on the one hand, that the electric field suppression of the critical current is not simply related to a conventional thermal-like quasiparticle overheating in the weak-link region. On the other hand, our results may open the way to operate an electrostatic-driven manipulation of phase slips in metallic Josephson nanojunctions, which can be pivotal for the control of decoherence in superconducting nanostructures.
Source-reported materials — not catalogue approval
| Formula | Reported Tc (K) | Pressure (GPa) | Type |
|---|---|---|---|
| Ti Archive — visibility unverified Source-occurrence policy only; no material identity or catalogue acceptance is inferred from the formula. | 0.31 | Pressure unresolved | onset |
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