Magnetic, Thermal, and Topographic Imaging with a Nanometer-Scale SQUID-On-Lever Scanning Probe
M. Wyss, K. Bagani, D. Jetter, E. Marchiori, A. Vervelaki, B. Gross, J. Ridderbos, S. Gliga, C. Schönenberger, M. Poggio
DOI 10.1103/PhysRevApplied.17.034002 · Physical Review Applied
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Abstract
Scanning superconducting quantum interference device (SQUID) microscopy is a magnetic imaging technique combining high field sensitivity with nanometer-scale spatial resolution. Here, we demonstrate a scanning probe that combines the magnetic and thermal imaging provided by an on-tip SQUID with the tip-sample distance control and topographic contrast of a noncontact atomic force microscope (AFM). We pattern the nanometer-scale SQUID, including its weak-link Josephson junctions, via focused-ion-beam milling at the apex of a cantilever coated with Nb, yielding a sensor with an effective diameter of 365 nm, field sensitivity of 9.5nT/Hz, and thermal sensitivity of 620nK/Hz, operating in magnetic fields up to 1.0 T. The resulting SQUID-on-lever probe is a robust AFM-like scanning probe that expands the reach of sensitive nanometer-scale magnetic and thermal imaging beyond what is currently possible.
Source-reported materials — not catalogue approval
| Formula | Reported Tc (K) | Pressure (GPa) | Type |
|---|---|---|---|
| Nb Archive — visibility unverified Source-occurrence policy only; no material identity or catalogue acceptance is inferred from the formula. | 5.8 | Pressure not reported | unknown |
| Nb Archive — visibility unverified Source-occurrence policy only; no material identity or catalogue acceptance is inferred from the formula. | 8.8 | Pressure not reported | unknown |
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