Maximum limit of connectivity in rectangular superconducting films with an oblique weak link
F. Colauto, D. Carmo, A.M.H. de Andrade, A.A.M. Oliveira, M. Motta, W.A. Ortiz
DOI 10.1103/PhysRevApplied.23.044027 · Physical Review Applied
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Abstract
A method for measuring the electrical connectivity between parts of a rectangular superconductor has been developed for weak links making an arbitrary angle with the long side of a sample. The method is based on magneto-optical observation of characteristic lines where the critical current makes discontinuous deviations in the flow direction to adapt to the nonuniform condition created by the presence of the weak link. Assuming the Bean critical state model in the full penetration regime for a sample submitted to a perpendicular magnetic field, the complete flow pattern of screening currents is reconstructed, from which the transparency of the weak link, i.e., the ratio between its critical current and that of the pristine sample, τ=Ji/Jc, is then related to the angle θ formed by two characteristic discontinuity lines, which, in turn, are intimately associated with the presence of the weak link. The streamline distribution is compared with magneto-optical observations of the flux penetration in Nb superconducting films, where a weak link was created using focused ion-beam milling. The present work generalizes previous analyses in which the weak link was perpendicular to the long sides of the rectangular sample. Equations and measurements demonstrate that the relationship between the transparency and the angle θ is not affected by the tilting of the weak link. Noticeably, in order to attain optimum connectivity, the weak link critical current can be less than that of the pristine sample, namely, τmax=sinΦ, where Φ is the tilt angle of the weak link. This expression generalizes the previous result of τmax=1 for Φ=90∘.
Source-reported materials — not catalogue approval
| Formula | Reported Tc (K) | Pressure (GPa) | Type |
|---|---|---|---|
| Nb Archive — visibility unverified Source-occurrence policy only; no material identity or catalogue acceptance is inferred from the formula. | — | Pressure unresolved | unknown |
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