Measurement of the oxygen content in high-Tc superconductors: Enhanced resonant ion-scattering analysis
J. C. Barbour, B. L. Doyle, S. M. Myers
DOI 10.1103/PhysRevB.38.7005 · Physical Review B
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Abstract
A simple and accurate method is demonstrated to measure oxygen concentrations in thin films of R1Ba2Cu3O7−δ (1:2:3 phase, where R stands for the rare-earth element) by ion-beam analysis. Enhanced ion-scattering cross sections for 2.5-MeV protons and 8.7-MeV alpha particles, with depth resolutions of 200 and 50 nm, respectively, have been used to determine the oxygen content of laterally uniform thin-film and bulk superconductors. Both the H and He ion-beam analysis techniques are demonstrated to have the needed accuracy (Δδ=0.3) to ensure the proper composition for high-temperature superconductors in the 1:2:3 phase. These two techniques are based on enhanced ion-scattering cross section (σ) for which the ratios of σ to the Rutherford cross sections are 5 for 2.5-MeV protons, and 22 for 8.7-MeV alpha particles.
Source-reported materials — not catalogue approval
| Formula | Reported Tc (K) | Pressure (GPa) | Type |
|---|---|---|---|
| Y1Ba2Cu3O7-δ Archive — visibility unverified Source-occurrence policy only; no material identity or catalogue acceptance is inferred from the formula. | 90 | Pressure not reported | onset |
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