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Determination of the perpendicular penetration depth in superconducting thin films from the observation of nonuniform supercurrent flow

Deuk Soo Pyun, Eric R. Ulm, Thomas R. Lemberger

DOI 10.1103/PhysRevB.39.4140 · Physical Review B

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Abstract

By observing the nonuniform supercurrent density in wide superconducting thin films with a tunneling technique, we determine the perpendicular penetration depth λp of the film. λp has the predicted dependence on normalized temperature T/Tc and on sheet resistance R□, but is a factor of 1.5 to 2 larger than expected theoretically, even when strong electron-phonon coupling is taken into account.

Source-reported materials — not catalogue approval

FormulaReported Tc (K)Pressure (GPa)Type
InOx

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3.37Pressure not reportedunknown
InOx

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3.08Pressure not reportedunknown
InOx

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3.78Pressure not reportedunknown
InOx

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2.95Pressure not reportedunknown
InOx

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3.6Pressure not reportedunknown
InOx

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2.19Pressure not reportedunknown
InOx

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2.65Pressure not reportedunknown

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