Thickness dependence of flux-line-lattice melting in high-Tc superconducting films

H. R. Glyde; F. Lesage; P. Findeisen

doi:10.1103/PhysRevB.46.9175

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Thickness dependence of flux-line-lattice melting in high-Tc superconducting films

H. R. Glyde, F. Lesage, P. Findeisen

DOI 10.1103/PhysRevB.46.9175 · Physical Review B

T1

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Abstract

Civale et al. have recently measured the irreversibility line of YBa2Cu3O7−x (YBCO) films in the magnetic field-temperature plane, Birr(T), as a function of film thickness. We are able to reproduce the observed shift of Birr(T) to lower temperatures as the film thickness is reduced within a model of flux-line-lattice melting without pinning. While pinning must be important, this suggests Birr(T) is at least partly an intrinsic property. The onset of the shift of Birr(T) begins for films thinner than 1000–1500 Å in YBCO. The present model predicts that the onset will begin for films thinner than 100–150 Å in Bi2Sr2CaCu2O8.

Source-reported materials — not catalogue approval

Formula	Reported Tc (K)	Pressure (GPa)	Type
YBa2Cu3O7-x Archive — visibility unverified Source-occurrence policy only; no material identity or catalogue acceptance is inferred from the formula.	—	Pressure not reported	unknown
Bi2Sr2CaCu2O8 Archive — visibility unverified Source-occurrence policy only; no material identity or catalogue acceptance is inferred from the formula.	—	Pressure not reported	unknown