Kinetic inductance and penetration depth of thin superconducting films measured by THz-pulse spectroscopy

S. D. Brorson; R. Buhleier; J. O. White; I. E. Trofimov; H.-U. Habermeier; J. Kuhl

doi:10.1103/PhysRevB.49.6185

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Kinetic inductance and penetration depth of thin superconducting films measured by THz-pulse spectroscopy

S. D. Brorson, R. Buhleier, J. O. White, I. E. Trofimov, H.-U. Habermeier, J. Kuhl

DOI 10.1103/PhysRevB.49.6185 · Physical Review B

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Abstract

We measure the transmission of THz pulses through thin films of YBa2Cu3O7−δ at temperatures between 10 and 300 K. The pulses possess a usable bandwidth extending from ∼0.1 to 1.5 THz (3.3–50 cm−1). Below Tc we observe pulse reshaping caused by the kinetic inductance of the superconducting charge carriers. From transmission data, we extract values of the London penetration depth, as a function of temperature, and find that they agree well with a functional form (λ(0)/λ(T))2=1-(T/Tc)α, where λ(0)=148 nm and α=2.

Source-reported materials — not catalogue approval

Formula	Reported Tc (K)	Pressure (GPa)	Type
YBa2Cu3O7-δ Archive — visibility unverified Source-occurrence policy only; no material identity or catalogue acceptance is inferred from the formula.	92	Pressure not reported	onset