Magnetic properties of thin Ni films measured by a dc SQUID-based magnetic microscope

O. V. Snigirev; K. E. Andreev; A. M. Tishin; S. A. Gudoshnikov; J. Bohr

doi:10.1103/PhysRevB.55.14429

← Back to search

Magnetic properties of thin Ni films measured by a dc SQUID-based magnetic microscope

O. V. Snigirev, K. E. Andreev, A. M. Tishin, S. A. Gudoshnikov, J. Bohr

DOI 10.1103/PhysRevB.55.14429 · Physical Review B

T1

Active bibliographic source — not scientific approval

Bibliographic access preserves source history; it does not approve extracted materials or validate reported claims. Review warnings on each occurrence separately.

Abstract

We have applied a scanning HTS (high-temperature superconductor) dc SQUID (superconducting quantum interference device) -based magnetic microscope to study the magnetic properties of Au/Ni/Si(100) films in the thickness range from 8 to 200 Å at T=77 K. A one-domain structure with in-plane orientation of the magnetic moment was found for film thicknesses exceeding 26 Å. A drastic decrease of the magnetization of the film was detected when the thickness is less than 26 Å.