Josephson junctions with periodic defects: Ic(H) characteristics
N. Lazarides
DOI 10.1103/PhysRevB.68.092506 · Physical Review B
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Abstract
A simple analytical expression of the Ic(H) characteristics of Josephson junctions with thick periodic defects is obtained within the uniform field approximation. The analytical Ic(H), captures the important qualitative features seen in experiments, and completes the physical picture described by the current-blocking model. Due to its simplicity, it may be used to fit experimental data.
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