Interplay of doping and structural modulation in superconducting Bi2Sr2−xLaxCuO6+δ thin films
Z. Z. Li, H. Raffy, S. Bals, G. van Tendeloo, S. Megtert
DOI 10.1103/PhysRevB.71.174503 · Physical Review B
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Abstract
We have studied the evolution of the structural modulation in epitaxial, c-axis-oriented, Bi2Sr2−xLaxCuO6+δ thin films when varying the La content x and for a given x as a function of oxygen content. A series of thin films with 0⩽x⩽0.8 has been prepared in situ by rf-magnetron sputtering and characterized by R(T) measurements, Rutherford backscattering spectroscopy, transmission electron microscopy, and x-ray diffraction techniques. The oxygen content of each individual film was varied by thermal annealing across the phase diagram. The evolution of the structural modulation has been thoroughly studied by x-ray diffraction in determining the variation of the amplitude of satellite reflections in special two axes 2θ∕θ−θ scans (reciprocal space scans). It is shown that the amplitude of the modulation along the c axis decreases strongly when x increases from 0 to 0.2. It is demonstrated that this variation is essentially governed by La content x and that changing the oxygen content by thermal treatments has a much lower influence, even becoming negligible for x>0.2. Such study is important to understand the electronical properties of Bi2Sr2−xLaxCuO6+δ thin films.
Source-reported materials — not catalogue approval
| Formula | Reported Tc (K) | Pressure (GPa) | Type |
|---|---|---|---|
| Bi2Sr2CuO6+δ Archive — visibility unverified Source-occurrence policy only; no material identity or catalogue acceptance is inferred from the formula. | 20 | Pressure not reported | zero_resistance |
| Bi2Sr1.95La0.05CuO6+δ Archive — visibility unverified Source-occurrence policy only; no material identity or catalogue acceptance is inferred from the formula. | 20 | Pressure not reported | zero_resistance |
| Bi2Sr1.9La0.1CuO6+δ Archive — visibility unverified Source-occurrence policy only; no material identity or catalogue acceptance is inferred from the formula. | 20 | Pressure not reported | zero_resistance |
| Bi2Sr1.8La0.2CuO6+δ Archive — visibility unverified Source-occurrence policy only; no material identity or catalogue acceptance is inferred from the formula. | 30 | Pressure not reported | zero_resistance |
| Bi2Sr1.7La0.3CuO6+δ Archive — visibility unverified Source-occurrence policy only; no material identity or catalogue acceptance is inferred from the formula. | 30 | Pressure not reported | zero_resistance |
| Bi2Sr1.6La0.4CuO6+δ Archive — visibility unverified Source-occurrence policy only; no material identity or catalogue acceptance is inferred from the formula. | 30 | Pressure not reported | zero_resistance |
| Bi2Sr1.5La0.5CuO6+δ Archive — visibility unverified Source-occurrence policy only; no material identity or catalogue acceptance is inferred from the formula. | 20 | Pressure not reported | zero_resistance |
| Tl2Ba2CuO6 Archive — visibility unverified Source-occurrence policy only; no material identity or catalogue acceptance is inferred from the formula. | 80 | Pressure not reported | unknown |
| HgBa2CuO6 Archive — visibility unverified Source-occurrence policy only; no material identity or catalogue acceptance is inferred from the formula. | 94 | Pressure not reported | unknown |
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